Phasometric technique of automatic measurement of microwave devices complex parameters

被引：0
|
作者：
Gimpilevich, Yu.B. [1 ]
Vertegel, V.V. [1 ]
机构：
[1] Sevastopol'skij GTU, Sevastopol', Ukraine
来源：
Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika | 2003年 / 46卷 / 05期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
4
引用
收藏
页码：64 / 72
相关论文
共 50 条
  • [41] A Complex Permittivity Measurement Technique for High Dielectric Constant Materials at Microwave Frequency
    Xia, Song
    Xu, Zhuo
    Wei, Xiaoyong
    FERROELECTRICS, 2010, 407 : 101 - 107
  • [42] MEASUREMENT OF PARAMETERS OF SEMICONDUCTOR DEVICES
    MAY, G
    ELECTRONIC ENGINEERING, 1967, 39 (474): : 483 - &
  • [43] Small-Signal, Complex Distortion and Waveform Measurement System for Multiport Microwave Devices
    El-Deeb, Walid S.
    Hashmi, Mohammad S.
    Boulejfen, Noureddine
    Ghannouchi, Fadhel M.
    IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2011, 14 (03) : 28 - 33
  • [44] Microwave temperature measurement in microfluidic devices
    Wong, David
    Yesiloz, Gurkan
    Boybay, Muhammed S.
    Ren, Carolyn L.
    LAB ON A CHIP, 2016, 16 (12) : 2192 - 2197
  • [45] COMPUTER MEASUREMENT SERVICE FOR MICROWAVE DEVICES
    不详
    MEASUREMENT AND CONTROL, 1973, 6 (11): : 453 - 454
  • [46] Transient Temperature Measurement of Microwave Devices
    Kendig, Dustin
    Yazawa, Kazuaki
    Shakouri, Ali
    2015 85TH ARFTG MICROWAVE MEASUREMENT CONFERENCE, 2015,
  • [47] Complex technological optimization of microwave devices
    Gudkov, A. G.
    KPBIMUKO 2007CRIMICO: 17TH INTERNATIONAL CRIMEAN CONFERENCE ON MICROWAVE & TELECOMMUNICATION TECHNOLOGY, VOLS 1 AND 2, CONFERENCE PROCEEDINGS, 2007, : 521 - 522
  • [48] Dynamic-Bias S-Parameters: A New Measurement Technique for Microwave Transistors
    Avolio, Gustavo
    Raffo, Antonio
    Vadala, Valeria
    Vannini, Giorgio
    Schreurs, Dominique M. M. -P.
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2016, 64 (11) : 3946 - 3955
  • [49] A MICROWAVE MEASUREMENT TECHNIQUE FOR CHARACTERIZING THE I-V-RELATIONSHIP FOR NEGATIVE DIFFERENTIAL CONDUCTANCE DEVICES
    HUANG, P
    PAN, DS
    LUHMANN, NC
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1993, 41 (08) : 1455 - 1458
  • [50] AUTOMATIC NOISE PARAMETERS DETERMINATION OF MICROWAVE MESFETS
    CHUSSEAU, L
    PARISOT, M
    JOUSSEAUME, N
    ANNALES DES TELECOMMUNICATIONS-ANNALS OF TELECOMMUNICATIONS, 1988, 43 (5-6): : 323 - 330
12345