Preparation and characterization of graphene and few-layer graphene

被引:0
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作者
Feng, Ying [1 ]
Huang, Shi-Hua [1 ]
Kang, Kai [1 ]
Duan, Xiao-Xia [1 ]
机构
[1] Beijing Jiaotong University, Institute of Optoelectrical Technology, Beijing 100044, China
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关键词
Atomic force microscopy - Chemical vapor deposition - Microscopes - Pyrolytic graphite - Silica - Silicon oxides;
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摘要
Few-layer graphene was prepared from highly oriented pyrolytic graphite by micromechanical cleavage and transferred to the silicaon coated with silicon dioxide (SiO2/Si). The thickness of graphene on the SiO2/Si support was investigated by color and contrast variations under an optical microscope. Atomic force microscopy and Raman spectroscopy were used to determine the number of layers. Results show that a monolayer, double layers and multiple layers of graphene were prepared. The optical microscope images can give a satisfactory identification of the graphene thickness on SiO2/Si. In the Raman spectrum the 2D band is narrower and G band is weaker for double layers than that for multiple layers. Chemical vapor deposition was also used to grow large area (~cm2) graphene. However, micromechanical cleavage is a more simple method to prepare graphene.
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页码:26 / 30
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