Thickness dependence of c/a polytwin structures observed in epitaxial oxide ferroelectric thin films

被引：0
|
作者：
Alpay, S. Pamir [1 ]
Roytburd, Alexander L. [1 ]
机构：
[1] Dept. of Mat. and Nucl. Engineering, University of Maryland, College Park, MD 20742, United States
来源：
Turkish Journal of Physics | 2000年 / 24卷 / 02期
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摘要：
31
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页码：85 / 91
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