Transmission electron microscopy of AlGaAs/GaAs quantum cascade laser structures

被引：0
|
作者：
Walther, T. [1 ,3 ]
Krysa, A.B. [2 ,3 ]
机构：
[1] Kroto Centre for High Resolution Imaging and Analysis, University of Sheffield, Sheffield, United Kingdom
[2] EPSRC National Centre for III/V-Technologies, University of Sheffield, Sheffield, United Kingdom
[3] Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield, United Kingdom
来源：
Journal of Microscopy | 2017年 / 268卷 / 03期
关键词：
Compilation and indexing terms; Copyright 2024 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
AlGaAs/GaAs - Annular dark field scanning transmission electron microscopy - Composition mapping - Infrared radiation sources - Period length - Quantum cascade laser - Quantum cascade laser structures - Thin layers - Transmission electron microscopy - Z contrasts
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页码：298 / 304
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