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- [31] Emissivity compensated pyrometry for specular silicon surfaces on the NIST RTP test bedRTP 2004: 12TH IEEE INTERNATIONAL CONFERENCE ON ADVANCED THERMAL PROCESSING OF SEMICONDUCTORS : RTP 2004, 2004, : 167 - 172Tsai, BKBodycomb, JDeWitt, DPKreider, KGKimes, WA
- [33] WORKSHOP ON QUANTUM COMPUTING AND COMMUNICATION CONVENED AT NISTJOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1994, 99 (05): : 716 - 716不详
- [34] HELP toolbox user's guide published; NIST hosts workshop on pressing needs in UV metrology; Workshop held on characterization of nuclear reactor pressure vessel steels Journal of Research of the National Institute of Standards and Technology, 1999, 104 (06):
- [38] NIST workshop on metrology and modeling of color and appearanceColor Research and Application, 2002, 27 (01):Nadal, Maria E.McKnight, Mary E.
- [39] TESTERS OPEN DIALOG AT INAUGURAL NIST WORKSHOPIEEE SOFTWARE, 1994, 11 (05) : 120 - 121GRAY, MLIBURDY, K
- [40] NIST workshop on thin dielectric film metrologyJournal of Research of the National Institute of Standards and Technology, 1998, 103 (04):Belzer, Barbara J.Ehrstein, James R.
