Dual-path point-diffraction interference system for three-dimensional measurement

被引：0
|
作者：
Wang, Daodang [1 ,2 ]
Wang, Zhichao [1 ]
Zhao, Jun [1 ]
Wang, Chao [1 ]
Kong, Ming [1 ]
机构：
[1] College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou,310018, China
[2] College of Electrical Engineering, Zhejiang University, Hangzhou,310027, China
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2017年 / 38卷 / 09期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Diffraction - Iterative methods - Wavefronts
引用
收藏
页码：2146 / 2153
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