Numerical simulation research on scattering light imaging of surface defects of optical components

被引：0
|
作者：
Wang, Shitong [1 ]
Yang, Yongying [1 ]
Zhao, Limin [1 ]
Chai, Huiting [1 ]
Liu, Dong [1 ]
Bai, Jian [1 ]
Shen, Yibing [1 ]
机构：
[1] State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou,Zhejiang,310027, China
来源：
Zhongguo Jiguang/Chinese Journal of Lasers | 2015年 / 42卷 / 07期
关键词：
D O I：
10.3788/CJL201542.0708005
中图分类号：
学科分类号：
摘要：
20
引用
收藏
相关论文
共 50 条
  • [1] Numerical simulation research and applications on scattering imaging of surface defects on optical components
    Chai, Huiting
    Cao, Pin
    Yang, Yongying
    Li, Chen
    Wu, Fan
    Zhang, Yihui
    Xiong, Haoliang
    Zhou, Lin
    Yan, Kai
    Xu, Wenlin
    Liu, Dong
    Bai, Jian
    Shen, Yibing
    OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IV, 2016, 10023
  • [2] Simulation and detection of surface defects of optical components
    Hou, Jinyao
    Wang, Shuyi
    Sun, Xueping
    Liu, Weiguo
    Shun, Zhou
    Gao, Aihua
    Cheng, Jin
    OPTICAL ENGINEERING, 2024, 63 (12)
  • [3] Simulation research on the light-scattering properties of the subsurface damage of optical components
    Tian, Ailing
    Wang, Hui
    Wang, Chunhui
    Zhongguo Jiguang/Chinese Journal of Lasers, 2013, 40 (09):
  • [4] Research on the Stamping Surface Defects of Sheet based on Numerical Simulation
    Yang, Wei Feng
    MANUFACTURING, DESIGN SCIENCE AND INFORMATION ENGINEERING, VOLS I AND II, 2015, : 1601 - 1607
  • [5] Numerical simulation of the reflected acoustic wave components in the near field of surface defects
    Guan, JF
    Shen, ZH
    Ni, XW
    Wang, JJ
    Lu, J
    Xu, BQ
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2006, 39 (06) : 1237 - 1243
  • [6] Numerical simulation of nonlocal optical response in light scattering by nanoparticle on the substrate
    Lopushenko, Ivan V.
    PLASMONICS: DESIGN, MATERIALS, FABRICATION, CHARACTERIZATION, AND APPLICATIONS XV, 2017, 10346
  • [7] Electromagnetic simulation model of microscopic scattering dark-field imaging for optical components surface defect detection
    Lou, Weimin
    Cao, Pin
    Hu, Haotian
    Lu, Zichen
    Yang, Yongying
    OPTICAL TECHNOLOGY AND MEASUREMENT FOR INDUSTRIAL APPLICATIONS 2020, 2020, 11523
  • [8] Measurements of surface defects on optical components
    Gomez, S
    Hale, K
    Burrows, J
    Griffiths, B
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (04) : 607 - 616
  • [9] Research on Scattering and Imaging Simulation From the Object and Randomly Rough Surface
    Jin, Ya-Qiu
    APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5, 2008, : 1365 - 1368
  • [10] Research on light scattering characteristics of rough surface and optical constants deduction
    Wang, Ming-Jun
    Dong, Yan-Bing
    Wu, Zhen-Sen
    Deng, Rong
    Wang, Yun-Qiang
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2004, 33 (05): : 549 - 552
12345