abric Defect Detection Based on Template Correction and Low-Rank Decomposition

被引：0
|
作者：
Ji, Xuan [1 ]
Liang, Jiuzhen [1 ]
Hou, Zhenjie [1 ]
Chang, Xingzhi [1 ]
Liu, Wei [1 ]
机构：
[1] School of Information Science and Engineering, Changzhou University, Changzhou,213164, China
来源：
Moshi Shibie yu Rengong Zhineng/Pattern Recognition and Artificial Intelligence | 2019年 / 32卷 / 03期
基金：
中国国家自然科学基金;
关键词：
Deformation - Pattern recognition - Image segmentation - Defects;
D O I：
10.16451/j.cnki.issn1003-6059.201903008
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：268 / 277
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