Visual Inspection Solutions Based on the Application of Deep Learning to Image Processing Controllers

被引：0

作者：

Yokoi, Hidehiko ^{[1
]}

Takagi, Kazuhisa ^{[1
]}

Onishi, Yoshifumi ^{[2
]}

Kawamoto, Masahiro ^{[2
]}

Hirose, Mao ^{[3
]}

Mizuno, Yoshinori ^{[4
]}

机构：

[1] AI Platform Division

[2] Smart Industry Division

[3] Embedded Business Sales Division

[4] Platform Solution Division

来源：

NEC Technical Journal | 2020年 / 14卷 / 01期

关键词：

Deep learning - Image classification - Inspection equipment - Learning systems - Transfer learning;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The use of artificial intelligence (AI) in product inspection applications is becoming increasingly common. This paper examines a joint effort between NEC and Nippon Electro-Sensory Devices (NED) — a manufacturer specializing in line sensor systems — to create a defective product detection system that incorporates NEC’s RAPID machine learning in image processing software used in image inspection systems. In addition to providing customer value which makes it easy to build an image inspection system incorporating machine learning, we have incorporated other cutting-edge NEC technology into NED’s products with a view to deploying these solutions in new fields and promoting digitalization in manufacturing. © 2020 NEC Mediaproducts. All rights reserved.

引用

页码：35 / 39

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