SIPFA: Statistical Ineffective Persistent Faults Analysis on Feistel Ciphers

被引:1
|
作者
Bagheri N. [1 ,2 ]
Sadeghi S. [3 ,4 ]
Ravi P. [5 ]
Bhasin S. [5 ]
Soleimany H. [6 ]
机构
[1] CPS2lab., Shahid Rajaee Teacher Training University, Tehran
[2] School of Computer Science(SCS), Institute for Research in Fundamental Sciences (IPM), Tehran
[3] Department of Mathematics, Institute for Advanced Studies in Basic Sciences (IASBS), Zanjan
[4] Research Center for Basic Sciences and Modern Technologies (RBST), Institute for Advanced Studies in Basic Sciences (IASBS), Zanjan
[5] Temasek Laboratories, NTU
[6] Cyber Research Center, Shahid Beheshti University, Tehran
来源
IACR Transactions on Cryptographic Hardware and Embedded Systems | 2022年 / 2022卷 / 03期
基金
新加坡国家研究基金会;
关键词
3DES; Camellia; DES; Fault Attack; Feistel Ciphers; Persistent Fault Analysis; Statistical Ineffective Fault Analysis;
D O I
10.46586/tches.v2022.i3.367-390
中图分类号
学科分类号
摘要
Persistent Fault Analysis (PFA) is an innovative and powerful analysis technique in which fault persists throughout the execution. The prior prominent results on PFA were on SPN block ciphers, and the security of Feistel ciphers against this attack has received less attention. In this paper, we introduce a framework to utilize Statistical Ineffective Fault Analysis (SIFA) in the persistent fault setting by proposing Statistical Ineffective Persistent Faults Analysis (SIPFA) that can be efficiently applied to Feistel ciphers in a variety of scenarios. To demonstrate the effectiveness of our technique, we apply SIFPA on three widely used Feistel schemes, DES, 3DES, and Camellia. Our analysis reveals that the secret key of these block ciphers can be extracted with a complexity of at most 250 utilizing a single unknown fault. Furthermore, we demonstrate that the secret can be recovered in a fraction of a second by increasing the adversary’s control over the injected faults. To evaluate SIPFA in a variety of scenarios, we conducted both simulations and real experiments utilizing electromagnetic fault injection on DES and 3DES. © 2022, Ruhr-University of Bochum. All rights reserved.
引用
收藏
页码:367 / 390
页数:23
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