Influence of Surface Morphology on Absorptivity of Light-Absorbing Materials

被引:34
|
作者
Niu C. [1 ]
Zhu T. [1 ]
Lv Y. [1 ]
机构
[1] School of Instrument Science and Opto-Electronics Engineering, Beijing Information Science and Technology University, Beijing
来源
关键词
Electric fields - Incident light - Morphology - Silicon wafers - Surface roughness;
D O I
10.1155/2019/1476217
中图分类号
学科分类号
摘要
Absorptivity of three kinds of surface morphology, i.e., V-type groove surface, sinusoidal surface, and random distribution, is investigated using a rigorous electromagnetic theory and a finite element method. Influences of surface contour parameters (span distance, intersection angle, and height) and light wave parameters (incident angle and wavelength) on absorptivity are numerically simulated and analyzed for the three kinds of surfaces, respectively. Absorbing spectra about three silicon wafers with different surface roughness are recorded, and the results are coincident with simulated results. © 2019 Chunhui Niu et al.
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