Failure Mechanism Analysis of Busbar of MMC Submodule Under DC Fault

被引:0
|
作者
Cai Y. [1 ,2 ,3 ]
Guo W. [1 ,2 ]
Du X. [1 ,2 ]
Guo W. [1 ,2 ]
Zhao C. [1 ,2 ,3 ]
Sang W. [1 ,2 ,3 ]
机构
[1] Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing
[2] Key Laboratory of Applied Superconductivity, Chinese Academy of Sciences, Beijing
[3] University of Chinese Academy of Sciences, Beijing
[4] State Grid NARI Group Corporation, Beijing
[5] C-EPRI Electric Power Engineering Co., Ltd., Beijing
来源
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
DC fault; Failure mechanism; Modular multilevel converter; Multiphysics analysis; Submodule busbar;
D O I
10.13336/j.1003-6520.hve.20200847
中图分类号
O441.1 [电学]; TM12 [];
学科分类号
摘要
Overcurrent induced by DC fault may cause great electromagnetic force and temperature rise on the busbar of modular multilevel converter (MMC) submodule, which may result in permanent failure of the busbar. In order to explore the failure mechanism of the busbar under DC fault, we analyzed the electromagnetic-temperature-mechanical coupling field of the busbar based on DC fault calculation and multiphysical field simulation. First of all, based on the arm equivalent model, we accurately calculated the arm fault current, analyzed the influence of fault time on the arm fault current, and obtained the most serious fault current magnitude that may occur on the submodule busbar. Secondly, the electromagnetic force and Joule heat of each part submodule busbar were modeled, and the temperature rise and stress distribution of each part of busbar were solved. The calculation results show that the temperature rise of the busbar is negligible, but the mechanical stress is large, the deformation is serious, and the axial force on the bypass thyristor bolts is the largest of all, which may cause bolt detachment failure. This paper provides useful information for MMC submodule busbar failure analysis and design. © 2020, High Voltage Engineering Editorial Department of CEPRI. All right reserved.
引用
收藏
页码:3460 / 3468
页数:8
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