Frequency domain analysis of 3ω-scanning thermal microscope probe-Application to tip/surface thermal interface measurements in vacuum environment

被引：0
|
作者：
Pernot, G. [1 ]
Metjari, A. [1 ]
Chaynes, H. [1 ]
Weber, M. [1 ]
Isaiev, M. [1 ]
Lacroix, D. [1 ]
机构：
[1] Université de Lorraine, Cnrs, Lemta, Nancy,F-54000, France
来源：
Journal of Applied Physics | 2021年 / 129卷 / 05期
关键词：
All Open Access; Green;
D O I：
暂无
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学科分类号：
摘要：
Probes
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