An ensemble-based deep semi-supervised learning for the classification of Wafer Bin Maps defect patterns

被引：0
|
作者：
Manivannan, Siyamalan [1 ]
机构：
[1] Department of Computer Science, Faculty of Science, University of Jaffna, Sri Lanka
来源：
Computers and Industrial Engineering | 2022年 / 172卷
关键词：
461.4 Ergonomics and Human Factors Engineering - 714.2 Semiconductor Devices and Integrated Circuits - 716.1 Information Theory and Signal Processing - 723.2 Data Processing and Image Processing - 723.5 Computer Applications - 731 Automatic Control Principles and Applications - 951 Materials Science;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
33
引用
收藏
相关论文
共 50 条
  • [41] Participatory Learning based Semi-supervised Classification
    Deng, Chao
    Guo, Mao-Zu
    Liu, Yang
    Li, Hai-Feng
    ICNC 2008: FOURTH INTERNATIONAL CONFERENCE ON NATURAL COMPUTATION, VOL 4, PROCEEDINGS, 2008, : 207 - 216
  • [42] Malware Classification Based on Semi-Supervised Learning
    Ding, Yu
    Zhang, XiaoYu
    Li, BinBin
    Xing, Jian
    Qiang, Qian
    Qi, ZiSen
    Guo, MengHan
    Jia, SiYu
    Wang, HaiPing
    SCIENCE OF CYBER SECURITY, SCISEC 2022, 2022, 13580 : 287 - 301
  • [43] Integrating content-based image retrieval and deep learning to improve wafer bin map defect patterns classification
    Chiu, Ming-Chuan
    Lee, Yen-Han
    Chen, Tao-Ming
    JOURNAL OF INDUSTRIAL AND PRODUCTION ENGINEERING, 2022, 39 (08) : 614 - 628
  • [44] A SEMI-SUPERVISED ENSEMBLE LEARNING ALGORITHM
    Jiang, Zhen
    Zhang, Shiyong
    2012 IEEE 2ND INTERNATIONAL CONFERENCE ON CLOUD COMPUTING AND INTELLIGENT SYSTEMS (CCIS) VOLS 1-3, 2012, : 913 - 918
  • [45] Few-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning
    Kim H.
    Yoon H.
    Kim H.
    Journal of Manufacturing Science and Engineering, 2024, 146 (07):
  • [46] Deep Semi-Supervised Learning
    Hailat, Zeyad
    Komarichev, Artem
    Chen, Xue-Wen
    2018 24TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION (ICPR), 2018, : 2154 - 2159
  • [47] Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification
    Kahng, Hyungu
    Kim, Seoung Bum
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2021, 34 (01) : 74 - 86
  • [48] Semi-supervised learning using frequent itemset and ensemble learning for SMS classification
    Ahmed, Ishtiaq
    Ali, Rahman
    Guan, Donghai
    Lee, Young-Koo
    Lee, Sungyoung
    Chung, TaeChoong
    EXPERT SYSTEMS WITH APPLICATIONS, 2015, 42 (03) : 1065 - 1073
  • [49] SEMI-SUPERVISED SCENE CLASSIFICATION FOR REMOTE SENSING IMAGES BASED ON CNN AND ENSEMBLE LEARNING
    Dai, Xueyuan
    Wu, Xiaofeng
    Wang, Bin
    Zhang, Liming
    IGARSS 2018 - 2018 IEEE INTERNATIONAL GEOSCIENCE AND REMOTE SENSING SYMPOSIUM, 2018, : 4732 - 4735
  • [50] Semi-supervised learning with ensemble self-training for cancer classification
    Wang, Qingyong
    Xia, Liang-Yong
    Chai, Hua
    Zhou, Yun
    2018 IEEE SMARTWORLD, UBIQUITOUS INTELLIGENCE & COMPUTING, ADVANCED & TRUSTED COMPUTING, SCALABLE COMPUTING & COMMUNICATIONS, CLOUD & BIG DATA COMPUTING, INTERNET OF PEOPLE AND SMART CITY INNOVATION (SMARTWORLD/SCALCOM/UIC/ATC/CBDCOM/IOP/SCI), 2018, : 796 - 803
12345