Proposal of intense pulsed light soldering process for improving the drop impact reliability of Sn–3.0Ag–0.5Cu ball grid array package

被引:7
|
作者
Min K.D. [1 ]
Ha E. [1 ]
Lee S. [2 ]
Hwang J.-S. [2 ]
Kang T. [2 ]
Joo J. [1 ]
Jung S.-B. [1 ]
机构
[1] School of Advanced Materials Science and Engineering, Sungkyunkwan University, 2066 Seobu-ro, Jangan-gu Suwon
[2] Package Engineering Team, Test & System Package, Samsung Electronics, 158 Baebang-ro, Baebang-eup Asan
基金
新加坡国家研究基金会;
关键词
Ball grid array; Intense pulsed light soldering; Intermetallic compound; Mechanical properties; Microjoining; Sn–3.0Ag–0.5Cu;
D O I
10.1016/j.jmapro.2023.05.007
中图分类号
学科分类号
摘要
Until now, electronic packages have been manufactured using the conventional convection reflow process. However, it is becoming challenging to apply the reflow process because it is time-consuming and produces thick intermetallic compounds (IMCs) at the joint interface. In addition, the reflow process consumes a lot of power because of the preheating required and the generation of waste heat, thereby interfering with carbon neutrality. To overcome these issues, the feasibility of intense pulsed light (IPL) radiation soldering for the ball grid array package assembly process was investigated in this study. A very thin IMC was formed at the IPL-soldered joint (IMC thickness = 1.2 μm) because of the short IPL process time. However, the IMC formed during the reflow process was 6.1 μm-thick. Thus, the drop impact reliability of the IPL-soldered joint (number of drops to failure = 277) substantially improved compared with that of the reflow-soldered joint (number of drops to failure = 103). In addition, the power consumption of the IPL radiation soldering process was 17.95 kWh, considerably lower than that of the conventional convection reflow process (29.50 kWh). Therefore, we suggest that IPL soldering has a high potential to reduce process time, IMC thickness (enhancing the drop impact reliability), and power consumption. © 2023
引用
收藏
页码:19 / 28
页数:9
相关论文
共 47 条
  • [31] Size dependence on shear fatigue and fracture behavior of ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints under current stressing
    Wang, Bo
    Li, Wangyun
    Pan, Kailin
    Huang, Wei
    Gong, Yubing
    FRONTIERS IN MATERIALS, 2024, 11
  • [32] Geometry effect on mechanical performance and fracture behavior of micro-scale ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder joints
    Qin, H. B.
    Zhang, X. P.
    Zhou, M. B.
    Li, X. P.
    Mai, Y-W
    MICROELECTRONICS RELIABILITY, 2015, 55 (08) : 1214 - 1225
  • [33] Solder Volume Effects on the Microstructure Evolution and Shear Fracture Behavior of Ball Grid Array Structure Sn-3.0Ag-0.5Cu Solder Interconnects
    Li, X. P.
    Xia, J. M.
    Zhou, M. B.
    Ma, X.
    Zhang, X. P.
    JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (12) : 2425 - 2435
  • [34] Solder Volume Effects on the Microstructure Evolution and Shear Fracture Behavior of Ball Grid Array Structure Sn-3.0Ag-0.5Cu Solder Interconnects
    X. P. Li
    J. M. Xia
    M. B. Zhou
    X. Ma
    X. P. Zhang
    Journal of Electronic Materials, 2011, 40 : 2425 - 2435
  • [35] Failure morphology after drop impact test of ball grid array (BGA) package with lead-free Sn-3.8Ag-0.7Cu and eutectic SnPb solders
    Jang, Jin-Wook
    De Silva, Ananda P.
    Drye, James E.
    Post, Steve L.
    Owens, Norman L.
    Lin, Jong-Kai
    Frear, Darrel R.
    IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2007, 30 (01): : 49 - 53
  • [36] Failure Morphology after the Drop Impact Test of the Ball Grid Array Package with Lead-Free Sn-3.8Ag-0.7Cu on Cu and Ni Under-Bump Metallurgies
    J.W. Jang
    J.K. Lin
    D.R. Frear
    Journal of Electronic Materials, 2007, 36 : 207 - 213
  • [37] Impact of Electrical Current on the Long-Term Reliability of Fine-Pitch Ball Grid Array Packages with Sn-Ag-Cu Solder Interconnects
    Tae-Kyu Lee
    Journal of Electronic Materials, 2013, 42 : 599 - 606
  • [38] Impact of Electrical Current on the Long-Term Reliability of Fine-Pitch Ball Grid Array Packages with Sn-Ag-Cu Solder Interconnects
    Lee, Tae-Kyu
    JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (04) : 599 - 606
  • [39] The Failure Models of Lead Free Sn-3.0Ag-0.5Cu Solder Joint Reliability Under Low-G and High-G Drop Impact
    Jian Gu
    YongPing Lei
    Jian Lin
    HanGuang Fu
    Zhongwei Wu
    Journal of Electronic Materials, 2017, 46 : 1396 - 1404
  • [40] The Failure Models of Lead Free Sn-3.0Ag-0.5Cu Solder Joint Reliability Under Low-G and High-G Drop Impact
    Gu, Jian
    Lei, YongPing
    Lin, Jian
    Fu, HanGuang
    Wu, Zhongwei
    JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (02) : 1396 - 1404