共 47 条
- [1] Sn/3.0Ag/0.5Cu tin ball tensile creep test INNOVATION, COMMUNICATION AND ENGINEERING, 2014, : 83 - 86
- [2] Electromigration reliability of Sn–3.0Ag–0.5Cu/Cu–Zn solder joints Journal of Materials Science: Materials in Electronics, 2019, 30 : 7645 - 7653
- [4] An Investigation on the Shear Toughness for Sn/3.0Ag/0.5Cu and Sn/37Pb Solder Ball Joints NEW MATERIALS AND PROCESSES, PTS 1-3, 2012, 476-478 : 2455 - +
- [5] Wave soldering using Sn/3.0Ag/0.5Cu solder and water soluble VOC-free flux IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2006, 29 (03): : 202 - 210
- [6] Effect of Electromigration on the Type of Drop Failure of Sn–3.0Ag–0.5Cu Solder Joints in PBGA Packages Journal of Electronic Materials, 2015, 44 : 3927 - 3933
- [7] Effect of the Welding Process on the Microstructure and Mechanical Properties of Au/Sn–3.0Ag–0.5Cu/Cu Solder Joints Journal of Electronic Materials, 2022, 51 : 1597 - 1607
- [8] Wettability, interfacial reactions, and impact strength of Sn–3.0Ag–0.5Cu solder/ENIG substrate used for fluxless soldering under formic acid atmosphere Journal of Materials Science, 2020, 55 : 3107 - 3117
- [9] Electromigration behavior of Cu/Sn3.0Ag0.5Cu/Cu ball grid array solder joints Journal of Materials Science: Materials in Electronics, 2019, 30 : 6224 - 6233
- [10] Study of accelerated shear creep behavior and fracture process of micro-scale ball grid array (BGA) structure Cu/Sn–3.0Ag–0.5Cu/Cu joints under coupled electro-thermo-mechanical loads Journal of Materials Science: Materials in Electronics, 2020, 31 : 15575 - 15588