Magnetic Depth Profiling of the Co/C60 Interface through Soft X-Ray Resonant Magnetic Reflectivity

被引：0

作者：

Verna, Adriano ^{[1
]}

Bergenti, Ilaria ^{[2
]}

Pasquali, Luca ^{[3
]}

Giglia, Angelo ^{[2
]}

Albonetti, Cristiano ^{[2
]}

Dediu, Valentin ^{[2
]}

Borgatti, Francesco ^{[2
]}

机构：

[1] Dipartimento di Scienze, CNISM, Università degli Studi Roma Tre, Rome, Italy

[2] Consiglio Nazionale delle Ricerche-Istituto per lo Studio dei Materiali Nanostrutturati (CNR-ISMN), Bologna, Italy

[3] Department of Engineering 'E. Ferrari, University of Modena and Reggio Emilia, Modena, Italy

来源：

IEEE Transactions on Magnetics | 2020年 / 56卷 / 05期

关键词：

Fullerene thin films - Organic-inorganic interface - Polycrystalline - Remanent magnetization - Sharp interface - Soft-X-ray reflectivity - Spintronic device - Structural and magnetic properties;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We have probed the structural and magnetic properties of a ferromagnetic/organic interface constituted by a polycrystalline Co layer deposited on a fullerene thin film through resonant soft X-ray reflectivity measurements. The fitting analysis of the reflectivity indicates the formation of a sharp interface with limited intermixing and a null remanent magnetization in a 1 nm thick region of the Co film at the interface with C60. This information contributes to elucidate the role of organic-inorganic interfaces in the charge and spin transport inside organic spintronic devices. © 1965-2012 IEEE.

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