Magnetic Depth Profiling of the Co/C60 Interface through Soft X-Ray Resonant Magnetic Reflectivity

被引：0
|
作者：
Verna, Adriano [1 ]
Bergenti, Ilaria [2 ]
Pasquali, Luca [3 ]
Giglia, Angelo [2 ]
Albonetti, Cristiano [2 ]
Dediu, Valentin [2 ]
Borgatti, Francesco [2 ]
机构：
[1] Dipartimento di Scienze, CNISM, Università degli Studi Roma Tre, Rome, Italy
[2] Consiglio Nazionale delle Ricerche-Istituto per lo Studio dei Materiali Nanostrutturati (CNR-ISMN), Bologna, Italy
[3] Department of Engineering 'E. Ferrari, University of Modena and Reggio Emilia, Modena, Italy
来源：
IEEE Transactions on Magnetics | 2020年 / 56卷 / 05期
关键词：
Fullerene thin films - Organic-inorganic interface - Polycrystalline - Remanent magnetization - Sharp interface - Soft-X-ray reflectivity - Spintronic device - Structural and magnetic properties;
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摘要：
We have probed the structural and magnetic properties of a ferromagnetic/organic interface constituted by a polycrystalline Co layer deposited on a fullerene thin film through resonant soft X-ray reflectivity measurements. The fitting analysis of the reflectivity indicates the formation of a sharp interface with limited intermixing and a null remanent magnetization in a 1 nm thick region of the Co film at the interface with C60. This information contributes to elucidate the role of organic-inorganic interfaces in the charge and spin transport inside organic spintronic devices. © 1965-2012 IEEE.
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