Adaptive semi-empirical model for non-contact atomic force microscopy

被引：0

作者：

陈曦 ^{[1
]}

童君开 ^{[1
,2
]}

胡智鑫 ^{[1
]}

机构：

[1] Center for Joint Quantum Studies and Department of Physics Institute of Science Tianjin University

[2] State Key Laboratory of Precision Measuring Technology and Instruments Tianjin University

来源：

Chinese Physics B | 2022年 / 08期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

0803 ;

摘要：

Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution.Here we propose a new approach to estimate the interaction between its tips and samples, which combines a semi-empirical model with density functional theory(DFT) calculations. The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO, Cu, CuCl, and CuOtips. This approach achieves accuracy close to DFT calculation with much lower computational cost.

引用

页码：748 / 753

页数：6

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