Hydrogen permeation;
Gas barrier film;
Photochemistry;
Film elongation;
Film stress;
Photoconversion;
IRRADIATION;
DIFFUSION;
MEMBRANES;
D O I:
10.1016/j.ijhydene.2024.07.249
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Hydrogen permeation through uniaxially strained thin SiOx x based gas barrier films, formed at room temperature and ambient pressure on PET foil substrates by UV photochemical conversion (Photoconversion), was investigated using a dedicated measurement system. Hydrogen permeation measurements were conducted as a function of the stack of laminated single SiOx x barrier films, of the sample temperature as well as of the uniaxial mechanical strain applied to the samples. The results demonstrate a significant overall improvement of the hydrogen barrier properties for both single SiOx x barrier films on PET and laminated single SiOx x barrier films on PET. In the case of strained samples, the hydrogen barrier properties deteriorate due to stress-induced crack formation in the barrier films. This deterioration is strongest for strained single SiOx x barrier films but can be substantially reduced by laminating single SiOx x barrier films.
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
F. Jia
Q. Wang
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
Q. Wang
D. L. Zhu
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
D. L. Zhu
S. Han
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
S. Han
P. J. Cao
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
P. J. Cao
W. J. Liu
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
W. J. Liu
Y. X. Zeng
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
Y. X. Zeng
Y. M. Lu
论文数: 0引用数: 0
h-index: 0
机构:Shenzhen University,Shenzhen Key Laboratory of Special Functional Materials, Shenzhen Engineering Laboratory for Advanced Technology of Ceramics, College of Materials Science and Engineering
Y. M. Lu
Journal of Materials Science: Materials in Electronics,
2014,
25
: 2934
-
2938