A Comparative Study of HBL and VBL 3D DRAM: Signal Margin, Bit-cell Density, and Scalability

被引:1
|
作者
Wu, Xiangjin [1 ]
Upton, Luke R. [1 ]
Hsu, Po-Kai [2 ]
Chen, Jian [1 ]
Yu, Shimeng [2 ]
Wong, H-S Philip [1 ]
机构
[1] Stanford Univ, Stanford, CA 94305 USA
[2] Georgia Inst Technol, Atlanta, GA 30332 USA
关键词
D O I
10.1109/SNW63608.2024.10639232
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ongoing evolution of DRAM scaling can be enabled by monolithically stacking DRAM cells in the vertical direction (3D DRAM). However, there is no consensus as to whether 3D DRAM with horizontal bitline (HBL) or vertical bitline (VBL) is more scalable. Here we evaluate the signal margin and bitcell density of horizontal bitline (HBL) vs. vertical bitline (VBL) 3D DRAM using Coventor process model and circuit simulation. We show that VBL has 37% smaller BL-BL coupling noise and 2x higher iso-density signal margin than HBL at 64 layers. To surpass the density of 12 nm 4F2 DRAM while maintaining robust signal margin, VBL 3D DRAM requires similar to 50 layers, which is 35% fewer than HBL.
引用
收藏
页码:19 / 20
页数:2
相关论文
共 36 条
  • [1] Signal Margin, Density, and Scalability of 3-D DRAM: A Comparative Study of Two Bitline Architectures
    Wu, Xiangjin
    Upton, Luke R.
    Chen, Jian
    Hsu, Po-Kai
    Yu, Shimeng
    Wong, H. -S. Philip
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2025, 72 (02) : 671 - 677
  • [2] 3D STACKED CAPACITOR CELL FOR MEGA BIT DRAM
    NAKANO, T
    YABU, T
    FUJITSU SCIENTIFIC & TECHNICAL JOURNAL, 1988, 24 (04): : 301 - 317
  • [3] 3D stacked capacitor cell for Mega bit DRAM
    Nakano, Tomio
    Yabu, Takashi
    Fujitsu Scientific and Technical Journal, 1988, 24 (04): : 301 - 317
  • [4] Study on the Sub-threshold Margin Characteristics of the Extremely Scaled 3-D DRAM Cell Transistors
    Min, Kyung Kyu
    Kwon, Il-Woong
    Cho, Seehe
    Kwon, Mikyung
    Jang, Tae-Su
    Oh, Tae-Kyung
    Kim, Yong-Taik
    Cha, Seon-Yong
    Park, Sung-Kye
    Hong, Sung-Joo
    2015 IEEE 7TH INTERNATIONAL MEMORY WORKSHOP (IMW), 2015, : 121 - 124
  • [5] Automated cell analysis in 2D and 3D: A comparative study
    Meyer, Michael G.
    Fauver, Mark
    Rahn, J. Richard
    Neumann, Thomas
    Patten, Florence W.
    Seibel, Eric J.
    Nelson, Alan C.
    PATTERN RECOGNITION, 2009, 42 (01) : 141 - 146
  • [6] 3D Semicircular Flash Memory Cell: Novel Split-Gate Technology to Boost Bit Density
    Fujiwara, M.
    Morooka, T.
    Nagashima, S.
    Kato, T.
    Fukuda, N.
    Kariya, N.
    Ogura, T.
    Kurusu, T.
    Shimada, Y.
    Ishikawa, T.
    Arayashiki, Y.
    Hirayama, K.
    Koyama, Y.
    Kashiyama, S.
    Cai, W.
    Goki, Y.
    Sawa, K.
    Ikeno, D.
    Nishikawa, M.
    Uchiyama, Y.
    Ohtani, N.
    Arai, F.
    Kondo, M.
    2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2019,
  • [7] Comparative Study of Nonhybrid Density Functional Approximations for the Prediction of 3d Transition Metal Thermochemistry
    Determan, John J.
    Poole, Katelyn
    Scalmani, Giovanni
    Frisch, Michael J.
    Janesko, Benjamin G.
    Wilson, Angela K.
    JOURNAL OF CHEMICAL THEORY AND COMPUTATION, 2017, 13 (10) : 4907 - 4913
  • [8] Comparative Study of Single and Double Hybrid Density Functionals for the Prediction of 3d Transition Metal Thermochemistry
    Jiang, Wanyi
    Laury, Marie L.
    Powell, Mitchell
    Wilson, Angela K.
    JOURNAL OF CHEMICAL THEORY AND COMPUTATION, 2012, 8 (11) : 4102 - 4111
  • [9] Electronic structure of oxide, peroxide, and superoxide clusters of the 3d elements: A comparative density functional study
    Uzunova, Ellie L.
    Mikosch, Hans
    Nikolov, Georgi St.
    JOURNAL OF CHEMICAL PHYSICS, 2008, 128 (09):
  • [10] Study of signal pathways in 3D cell-scaffold systems based on image informatics framework
    Guo, Jin
    Tzeranis, Dimitrios S
    So, Peter T C
    Wei, Xun-Bin
    Shanghai Jiaotong Daxue Xuebao/Journal of Shanghai Jiaotong University, 2014, 48 (09): : 1257 - 1262