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Nanostructured aramid fiber/Cu/BN composite Janus films with broadband electromagnetic interference shielding and superior thermally conductive/ electrically insulating performance
被引:0
|作者:
Huang, Zhongxin
[1
,2
]
Wei, Haoshan
[5
]
Zhang, Yong
[1
,2
,4
]
Zhang, Xueru
[3
]
Cui, Jiewu
[1
,2
]
Wang, Yan
[1
,2
]
Liu, Jiaqin
[2
,4
]
Wu, Yucheng
[1
,2
]
机构:
[1] Hefei Univ Technol, Sch Mat Sci & Engn, Hefei 230009, Anhui, Peoples R China
[2] Key Lab Adv Funct Mat & Devices Anhui Prov, Hefei 230009, Peoples R China
[3] Hefei Univ Technol, Instrumental Anal Ctr, Hefei 230009, Peoples R China
[4] Hefei Univ Technol, Inst Ind & Equipment Technol, Hefei 230009, Anhui, Peoples R China
[5] Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Hefei 230009, Anhui, Peoples R China
基金:
中国国家自然科学基金;
关键词:
ANF@Cu-ANF/BN Janus structure;
Electromagnetic interference shielding;
Thermal properties;
Mechanical properties;
D O I:
10.1016/j.jallcom.2024.176360
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
Modern electronic technology necessitates the development of composite materials with effective electromagnetic protection. This work presents a novel strategy constructing an aramid nanofiber (ANF)-based Janus film (ANF@Cu-ANF/BN) using an electroless plating-vacuum assisted filtration-pressing technique. The film exhibits an unique asymmetric property profile, with one side being electrically conductive and thermally conductive/ electrically insulating on the other. Exceptional EMI shielding effectiveness of 105.22 and 106.96 dB is obtained in the 8.2-12.4 GHz and 26.5-40 GHz ranges, respectively. In addition, the film demonstrates an impressive outof-plane thermal conductivity of 2.703 W/(m & sdot;K). suggesting superior thermal management capabilities when integrated into heat sinks for high-power light-emitting diode modules. In terms of mechanical robustness, the film possesses a tensile strength of 14.31 MPa. The ANF@Cu-ANF/BN Janus composite films effectively harmonize electromagnetic shielding, thermal conductivity, and mechanical integrity, offering an innovative pathway of developing advanced materials that fulfill the stringent requirements of modern electronic devices.
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页数:11
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