共 41 条
- [31] Evaluation of fast neutron induced single event upset in a static random access memory and simulation by Monte Carlo N-Particle Code (MCNPX) JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (6B): : L797 - L799
- [32] Evaluation of fast neutron induced single event upset in a static random access memory and simulation by Monte Carlo N-Particle Code (MCNPX) Arita, Y., 1600, Japan Society of Applied Physics (43):
- [33] On the Correlation of Laser-induced and High-Energy Proton Beam-induced Single Event Latchup 2020 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2020,
- [37] Single Bit Upsets versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron - SECDED is No Longer Effective - 2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS, 2022, : 323 - 326
- [40] Heavy ion-induced single event upset sensitivity evaluation of 3D integrated static random access memory Nuclear Science and Techniques, 2018, 29