Impact of reflection Comptonization on x-ray reflection spectroscopy: The case of EXO 1846-031

被引:0
|
作者
Li, Songcheng [1 ,2 ]
Liu, Honghui [1 ,2 ]
Bambi, Cosimo [1 ,2 ,3 ]
Steiner, James F. [4 ]
Zhang, Zuobin [1 ,2 ]
机构
[1] Fudan Univ, Ctr Astron & Astrophys, Ctr Field Theory & Particle Phys, Shanghai 200438, Peoples R China
[2] Fudan Univ, Dept Phys, Shanghai 200438, Peoples R China
[3] New Uzbekistan Univ, Sch Nat Sci & Humanities, Tashkent 100007, Uzbekistan
[4] Ctr Astrophys Harvard & Smithsonian, Cambridge, MA 02138 USA
基金
中国国家自然科学基金; 上海市自然科学基金;
关键词
BLACK-HOLE; ACCRETION DISKS; SPECTRA; REVERBERATION; EMISSION; GRAVITY; MODEL; SPIN;
D O I
10.1103/PhysRevD.110.043021
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
Within the disk-corona model, it is natural to expect that a fraction of reflection photons from the disk are Compton scattered by the hot corona (reflection Comptonization), even if this effect is usually ignored in x-ray reflection spectroscopy studies. We study this effect by using NICER and NuSTAR data of the Galactic black hole EXO 1846-031 in the hard-intermediate state with the model simplcutx. . Our analysis suggests that a scattered fraction of order 10% is required to fit the data, but the inclusion of reflection Comptonization does not change appreciably the measurements of key parameters like the black hole spin and the inclination angle of the disk.
引用
收藏
页数:11
相关论文
共 50 条
  • [41] TOTAL REFLECTION X-RAY SPECTROMETRY
    LEYDEN, DE
    TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1985, 4 (03) : R8 - R9
  • [42] DOUBLE REFLECTION X-RAY CAMERA
    FRAENKEL, BS
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (08): : 726 - 727
  • [43] Characterisation of multilayers by X-ray reflection
    Steinfort, AJ
    Scholte, PMLO
    Tuinstra, F
    SURFACE SCIENCE, 1998, 409 (02) : 229 - 240
  • [44] MULTILAYER THEORY OF X-RAY REFLECTION
    HARPER, PG
    RAMCHURN, SK
    APPLIED OPTICS, 1987, 26 (04): : 713 - 718
  • [45] The Intensity of X-ray Reflection.
    Bragg, WL
    James, RW
    NATURE, 1922, 110 : 148 - 148
  • [46] Total reflection X-ray fluorescence
    Schmeling, Martina
    PHYSICAL SCIENCES REVIEWS, 2019, 4 (07)
  • [47] Quantum X-ray reflection in diamond
    Raman, CV
    Nilakantan, P
    NATURE, 1941, 147 : 118 - 119
  • [48] EFFECT OF X-RAY ANOMALOUS REFLECTION
    ROVINSKII, BM
    SINAISKI.VM
    SIDENKO, VI
    FIZIKA TVERDOGO TELA, 1972, 14 (02): : 409 - +
  • [49] X-ray reflection in a sample of X-ray bright ultraluminous X-ray sources
    Caballero-Garcia, M. D.
    Fabian, A. C.
    MONTHLY NOTICES OF THE ROYAL ASTRONOMICAL SOCIETY, 2010, 402 (04) : 2559 - 2566
  • [50] Measurement of glancing incidence exit X-ray scattering in reflection high energy electron diffraction and total-reflection-angle X-ray spectroscopy system
    Liu, ZY
    Ogota, S
    Morishita, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (10): : 5553 - 5557