Dark-field surface defects detection method for multi-surface-shape large aperture optical components

被引:0
|
作者
Guo, Shiwei [1 ,2 ]
Wang, Shiling [3 ]
Wang, Shaowen [1 ,2 ]
Wu, Lan [1 ,2 ]
Liu, Dong [1 ,2 ]
机构
[1] Zhejiang Univ, Coll Opt Sci & Engn, State Key Lab Extreme Photon & Instrumentat, Hangzhou 310027, Zhejiang, Peoples R China
[2] Zhejiang Univ, ZJU Hangzhou Global Sci & Technol Innovat Ctr, Hangzhou 311215, Peoples R China
[3] China Jiliang Univ, Coll Metrol & Measurement Engn, Hangzhou 310018, Peoples R China
关键词
REAL-TIME; DAMAGE; SCATTERING; MICROSCOPY;
D O I
10.1364/AO.531320
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In large-scale high-power optical systems such as inertial confinement fusion systems, the design of various optical components is often larger and more complex. Therefore, determining how to ensure the quality evaluation of optical components faces new challenges. As a key evaluation step for component quality, surface defects detection needs to consider improving the detection capability for various complex surface shapes and large aperture components. Meanwhile, the accuracy level of detection does not decrease with an increase in detection aperture size. The defects that need to be detected are typically small in size and randomly distributed throughout the aperture. Comprehensive aperture-wide information is required to ensure the thorough detection of defects in the components. Therefore, it is required that the detection system maintains compatibility with multi-surface shapes while balancing detection efficiency and accuracy. Against this background, the surface defects detection technology with high compatibility is explored in this paper. The illumination system of the dark-field imaging system and a generalized scanning path search strategy is proposed. Under the condition of ensuring a detection sensitivity of 0.5 mu m, surface defects detection for various types of optical components with apertures several hundred times larger than the detection field of view is achieved. (c) 2024 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.
引用
收藏
页码:6686 / 6695
页数:10
相关论文
共 50 条
  • [31] PHOTOELECTRIC INTERFEROMETER FOR INSPECTING THE SURFACE SHAPE OF LARGE OPTICAL-COMPONENTS
    GORSHKOV, VA
    FOMIN, ON
    GORLOV, SN
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1986, 53 (10): : 598 - 601
  • [32] Unsupervised surface defect detection of aluminum sheets with combined bright-field and dark-field illumination
    Sun, Qian
    Xu, Ke
    Liu, Huajie
    Wang, Jianer
    OPTICS AND LASERS IN ENGINEERING, 2023, 168
  • [33] Defects evaluation system for spherical optical surfaces based on microscopic scattering dark-field imaging method
    Zhang, Yihui
    Yang, Yongying
    Li, Chen
    Wu, Fan
    Chai, Huiting
    Yan, Kai
    Zhou, Lin
    Li, Yang
    Liu, Dong
    Bai, Jian
    Shen, Yibing
    APPLIED OPTICS, 2016, 55 (23) : 6162 - 6171
  • [34] Simulation design of dark-field imaging scene for optical spherical surface imperfection based on raytracing
    Zhang, Pengfei
    Yang, Yongying
    Zhang, Danhui
    OPTICAL TECHNOLOGY AND MEASUREMENT FOR INDUSTRIAL APPLICATIONS 2020, 2020, 11523
  • [35] Research on Defect Detection of Large-aperture Multi-faceted Optical Components
    Guo, Shiwei
    Lv, Xiongtao
    Lu, Yi
    Xie, Yuechen
    Zhang, Fengwei
    Wang, Shiling
    Wu, Lan
    Liu, Dong
    AOPC 2023:OPTIC FIBER GYRO, 2023, 12968
  • [36] Dark-field structured illumination microscopy for highly sensitive detection of 3D defects in optical materials
    Zhang, Ke
    Li, Lulu
    Liu, Qian
    OPTICS AND LASERS IN ENGINEERING, 2023, 161
  • [37] Localized surface plasmon resonance of single silver nanoparticles studied by dark-field optical microscopy and spectroscopy
    Cao, Wei
    Huang, Tao
    Xu, Xiao-Hong Nancy
    Elsayed-Ali, Hani E.
    JOURNAL OF APPLIED PHYSICS, 2011, 109 (03)
  • [38] Design of Point Diffraction Transient Interferometer for Surface Profile Measurement of Large Aperture Optical Components
    Jin, Leling
    Wang, Jian
    Zeng, Dazhou
    Zhang, Yajun
    Pu, Wei
    Luo, Mao
    Bian, Yinxu
    Kuang, Cuifang
    Liu, Xu
    ACTA OPTICA SINICA, 2025, 45 (03)
  • [39] An online color and shape integrated detection method for flexible packaging surface defects
    Sun, Yi
    Wei, Jiahong
    Li, Jinhua
    Wei, Qin
    Ye, Weiwei
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2024, 35 (06)
  • [40] THE INTERS LATERAL SHEARING INTERFEROMETER FOR INSPECTING THE SURFACE SHAPE OF LARGE OPTICAL-COMPONENTS
    GORSHKOV, VA
    KRYAKHTUNOV, VS
    FOMIN, ON
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1980, 47 (02): : 77 - 78