First-principles calculations of optical and positron annihilation properties of NV center in 3C-SiC C-SiC

被引:0
|
作者
Zhang, Hong-Tao [1 ]
Yan, Long [3 ]
Tang, Xian [1 ]
Cheng, Guo-Dong [2 ]
机构
[1] Univ South China, Sch Nucl Sci & Technol, Hengyang 421001, Peoples R China
[2] Univ South China, Sch Comp, Hengyang 421001, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
关键词
3C-SiC; Spin-defect; Optical transition; Temperature-dependent positron lifetime; Electron-positron momentum distribution; SEMICONDUCTORS; DIVACANCY; EXPANSION; ELECTRONS; DENSITY; ENERGY; SPINS;
D O I
10.1016/j.physleta.2024.129888
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We studied the optical and positron annihilation properties of N(C)V(S)i in 3C-SiC using first-principles calculations. We found that the charge-state transition and the spin-conserving optical transition levels are very close to each other. In order to distinguish between the NV center and intrinsic defect, we calculate in detail the defect formation energies, temperature-dependent positron lifetimes, and electron-positron momentum distribution of these defects in 3C-SiC. We suggest that using positrons technique alone is insufficiently sensitive in identifying the charge-states of N(C)V(S)i, necessitating the use of additional characterization methods to address this issue.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Optical and mechanical properties of C, Si, Ge, and 3C-SiC determined by first-principles theory using Heyd-Scuseria-Ernzerhof functional
    Liu, Xuejie
    Li, Liangfang
    Li, Qianqian
    Li, Ying
    Lu, Feng
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2013, 16 (06) : 1369 - 1376
  • [32] Study of thermal annealing of vacancies in ion implanted 3C-SiC by positron annihilation
    Ohshima, T.
    Uedono, A.
    Itoh, H.
    Abe, K.
    Suzuki, R.
    Ohdaira, T.
    Aoki, Y.
    Yoshikawa, M.
    Mikado, T.
    Okumura, H.
    Yoshida, S.
    Tanigawa, S.
    Nashiyama, I.
    Materials Science Forum, 1998, 264-268 (pt 2): : 745 - 748
  • [33] First principles calculation of dielectric properties of Al and N codoped 3C-SiC
    Zhou Peng-Li
    Zheng Shu-Kai
    Tian Yan
    Zhang Shuo-Ming
    Shi Ru-Qian
    He Jing-Fang
    Yan Xiao-Bing
    ACTA PHYSICA SINICA, 2014, 63 (05) : 053102
  • [34] Study of intrinsic defects in 3C-SiC using first-principles calculation with a hybrid functional
    Oda, Takuji
    Zhang, Yanwen
    Weber, William J.
    JOURNAL OF CHEMICAL PHYSICS, 2013, 139 (12):
  • [35] Study of thermal annealing of vacancies in ion implanted 3C-SiC by positron annihilation
    Ohshima, T
    Uedono, A
    Itoh, H
    Abe, K
    Suzuki, R
    Ohdaira, T
    Aoki, Y
    Yoshikawa, M
    Mikado, T
    Okumura, H
    Yoshida, S
    Tanigawa, S
    Nashiyama, I
    SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 745 - 748
  • [36] Understanding the adsorption behavior of oxygen on the 3C-SiC(110) surface: A first-principles study
    Peng, Sai
    Chen, Yijie
    Jia, Yunping
    Hu, Shuanglin
    Zhou, Xiaosong
    Xu, Canhui
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2023, 106 (06) : 3676 - 3687
  • [37] Diffusion of hydrogen isotopes in 3C-SiC in HTR-PM: A first-principles study
    Wang, Wenyi
    Li, Chuan
    Shang, Shun-Li
    Cao, Jianzhu
    Liu, Zi-Kui
    Wang, Yi
    Fang, Chao
    PROGRESS IN NUCLEAR ENERGY, 2020, 119
  • [38] The stability of 3C-SiC(111) on Si(111) thin films: First-principles calculation
    Abavare, Eric K. K.
    Kwakye-Awuah, Bright
    Nunoo, Oswald A.
    Amoako-Yirenkyire, Peter
    Gebreyesus, G.
    Yaya, Abu
    Singh, Keshaw
    CHEMICAL PHYSICS LETTERS, 2021, 766
  • [39] Structural stability, electronic and optical properties of Ni-doped 3C-SiC by first principles calculation
    Dou, Yankun
    Jin, Hai-bo
    Cao, Maosheng
    Fang, Xiaoyong
    Hou, Zhiling
    Li, Dan
    Agathopoulos, S.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2011, 509 (20) : 6117 - 6122
  • [40] First-principles calculations of positron annihilation in solids
    Barbiellini, B
    Hakala, M
    Nieminen, RM
    Puska, MJ
    OPTICAL PROPERTIES OF MATERIALS, 2000, 579 : 249 - 254