Levy noise-induced effects in a long Josephson junction in the presence of two different spatial noise distributions

We analyze the impact of Levy-distributed stochastic fluctuations on the average switching time and voltage drop across a current-biased long Josephson tunnel junction. We compare the system's response for two spatial configurations of time-dependent noise, i.e., homogeneous and distributed along the junction length. The response of the Josephson junction is explored by varying the characteristic parameter of the Levy source, i.e., the alpha stability index and the noise intensity. These findings offer an effective tool to characterize a Levy component possibly embedded in an unknown noise signal.