Spectroscopic-ellipsometry study of the optical properties of ZnO nanoparticle thin films

被引：1
|
作者：
Bhandari, Khagendra P. [1 ]
Sapkota, Dhurba R. [2 ]
Ramanujam, Balaji [2 ]
机构：
[1] Ohio Northern Univ, Dept Phys & Astron, 525 S Main St, Ada, OH 45810 USA
[2] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat, Dept Phys & Astron, 2801 W Bancroft St, Toledo, OH 43606 USA
来源：
MRS COMMUNICATIONS | 2024年 / 14卷 / 05期
关键词：
Nanostructure; Thin film; Absorption; Optical properties; X-ray diffraction; ZINC-OXIDE; CONTACT; SILICON;
D O I：
10.1557/s43579-024-00626-4
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We described optical properties of zinc oxide (ZnO) nanoparticles determined by spectroscopic ellipsometry analysis from ex situ spectroscopic ellipsometry (ex situ SE) measurements made on nanocrystalline thin films over a spectral range of 0.734 to 4.00 eV. We determined the complex refractive index function, n similar to(omega) = n(omega) + i kappa(omega), by fitting a layered parametric model to the ellipsometric measurements. We collected SE measurements at an incidence angle of 70 degrees. We also determined absorption coefficient spectra using extinction coefficient, kappa and wavelength, lambda. The direct optical bandgap of the films was obtained as 3.2 eV using the ellipsometric method.
引用
收藏
页码：1085 / 1089
页数：5
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