Random noise test of analog-to-digital converters

被引：0
|
作者：
Alegria, Francisco [1 ,2 ]
机构：
[1] Univ Tecn Lisboa, Inst Telecomunicacoes, Ave Rovisco Pais 1, P-1049001 Lisbon, Portugal
[2] Univ Lisbon, Inst Super Tecn, Ave Rovisco Pais 1, P-1049001 Lisbon, Portugal
来源：
ACTA IMEKO | 2023年 / 12卷 / 02期
关键词：
analog to digital converter; testing; noise; estimation; error analysis; random; applied mathematics; HISTOGRAM TEST; ADC; PERFORMANCE; UNCERTAINTY;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The random noise test of analog to digital converters recommended by the IEEE 1057 Standard for digitizing waveform recorders is studied. The heuristically derived expression presented for the estimation of the random noise standard deviation is experimentally validated. The standard suggests a triangular stimulus signal. Here we will show how to use a sinusoidal stimulus signal to carry out the test. The influence of stimulus signal offset and amplitude on the estimation error is also analyzed and an expression is presented to compute the minimum amplitude value that guarantees an upper bound on the estimator bias.
引用
收藏
页码：7 / 8
页数：2
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