Circular Dichroism Reflectance Anisotropy of Chiral Atomically Thin Films

被引:0
|
作者
Tomei, Ilaria [1 ]
Pierucci, Filippo [1 ]
Bonanni, Beatrice [1 ]
Sgarlata, Anna [1 ]
Fanfoni, Massimo [1 ]
Yang, Seong-Jun [2 ,3 ]
Kim, Cheol-Joo [2 ,3 ]
Goletti, Claudio [1 ]
机构
[1] Univ Roma Tor Vergata, Dept Phys, Via Ric Scientif 1, I-00133 Rome, Italy
[2] Inst Basic Sci IBS, Ctr Waals Quantum Solids, Pohang 37673, South Korea
[3] Pohang Univ Sci & Technol POSTECH, Dept Chem Engn, Pohang 37673, South Korea
基金
新加坡国家研究基金会;
关键词
reflectance anisotropy spectroscopy; circular dichroism; chiral layers; twisted graphene bilayers; SURFACE; SPECTROSCOPY; ADSORPTION; SYMMETRY;
D O I
10.3390/chemosensors12090170
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Recently, a technical modification of a Reflectance Anisotropy Spectroscopy (RAS) spectrometer has been proposed to investigate the circular dichroism (CD) of samples instead of the normally studied linear dichroism. CD-RAS measures the anisotropy of the optical properties of a sample under right-handed and left-handed circularly polarized light. Here, we present the application of CD-RAS to measure the circular dichroism of a twisted bilayer of graphene, purposely prepared as a possible substrate for the adsorption of thin molecular layers, in air, in liquid or in a vacuum. This result demonstrates the performance of the apparatus and shows interesting perspectives for the investigation of chiral organic assemblies deposited in solid film.
引用
收藏
页数:9
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