Optical modeling of systematic uncertainties in detector polarization angles for the Atacama Cosmology Telescope

被引:1
|
作者
Murphy, Colin C. [1 ]
Choi, Steve K. [2 ,3 ]
Datta, Rahul [4 ]
Devlin, Mark J. [5 ]
Hasselfield, Matthew [6 ]
Koopman, Brian J. [7 ]
Mcmahon, Jeff [4 ]
Naess, Sigurd [8 ]
Niemack, Michael D. [1 ,3 ]
Page, Lyman A.
Staggs, Suzanne T. [9 ]
Thornton, Robert [10 ]
Wollack, Edward J. [1 ,11 ]
机构
[1] Cornell Univ, Dept Phys, Ithaca, NY 14850 USA
[2] Univ Calif Riverside, Dept Phys & Astron, Riverside, CA 92521 USA
[3] Cornell Univ, Dept Astron, Ithaca, NY 14850 USA
[4] Univ Chicago, Dept Astron & Astrophys, Chicago, IL 60637 USA
[5] Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA
[6] Flatiron Inst, Ctr Computat Astrophys, New York, NY 10010 USA
[7] Yale Univ, Dept Phys, New Haven, CT 06511 USA
[8] Univ Oslo, Inst Theoret Astrophys, Oslo, Norway
[9] Princeton Univ, Dept Phys, Princeton, NJ 08544 USA
[10] West Chester Univ, Dept Phys, W Chester, PA 19383 USA
[11] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
基金
美国国家科学基金会; 加拿大创新基金会;
关键词
SYMMETRY; ARRAYS;
D O I
10.1364/AO.521079
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present an estimate of the Atacama Cosmology Telescope (ACT) detector polarization angle systematic uncertainty from optics perturbation analysis using polarization-sensitive ray tracing in CODE V optical design software. Uncertainties in polarization angle calibration in CMB measurements can limit constraints on cosmic birefringence and other cosmological parameters sensitive to polarization leakage. Our framework estimates the angle calibration systematic uncertainties from possible displacements in lens positions and orientations, and anti-reflection coating (ARC) thicknesses and refractive indices. With millimeter displacements in lens positions and percent-level perturbations in ARC thicknesses and indices from design, we find the total systematic uncertainty for three ACT detector arrays operating between 90 and 220 GHz to be at the 10th of degree scale. Reduced lens position and orientation uncertainties from physical measurements could lead to a reduction in the systematic uncertainty estimated with the framework presented here. This optical modeling may inform polarization angle systematic uncertainties for current and future microwave polarimeters, such as the CCAT Observatory, Simons Observatory, and CMB-S4. (c) 2024 Optica Publishing Group
引用
收藏
页码:5079 / 5087
页数:9
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