Adaptive Binning Coincidence Test for Uniformity Testing

被引:0
|
作者
Salgia, Sudeep [1 ]
Wang, Xinyi [1 ]
Zhao, Qing [1 ]
Tong, Lang [1 ]
机构
[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14850 USA
基金
美国国家科学基金会;
关键词
Testing; Complexity theory; Signal processing algorithms; Symbols; Random variables; Partitioning algorithms; Anomaly detection; Uniformity testing; adaptivity; coincidence test;
D O I
10.1109/TSP.2024.3397560
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We consider the problem of uniformity testing of Lipschitz continuous distributions with bounded support. The alternative hypothesis is a composite set of Lipschitz continuous distributions whose l(1) distances from the uniform distribution are bounded by epsilon from below. We propose a sequential test that adapts to the unknown distribution under the alternative hypothesis. Referred to as the Adaptive Binning Coincidence (ABC) test, the proposed strategy adapts in two ways. First, it partitions the set of alternative distributions into layers based on their distances to the uniform distribution. It then sequentially eliminates the alternative distributions layer by layer in decreasing distance to the uniform, allowing it to take advantage of favorable situations of a distant alternative by terminating early. Second, it adapts, across layers of the alternative distributions, the resolution level of the discretization for computing the coincidence statistic. The farther away the layer is from the uniform, the coarser the discretization necessary for eliminating this layer or terminating altogether. It thus terminates the test both early (via the layered partition of the alternative set) and quickly (via adaptive discretization) to take advantage of favorable alternative distributions. The ABC test builds on an adaptive sequential test for discrete distributions, which is of independent interest.
引用
收藏
页码:2421 / 2435
页数:15
相关论文
共 50 条
  • [21] Sparse Uniformity Testing
    Bhattacharya, Bhaswar B.
    Mukherjee, Rajarshi
    IEEE TRANSACTIONS ON INFORMATION THEORY, 2024, 70 (09) : 6371 - 6390
  • [22] Generalized Uniformity Testing
    Batu, Tugkan
    Canonne, Clement L.
    2017 IEEE 58TH ANNUAL SYMPOSIUM ON FOUNDATIONS OF COMPUTER SCIENCE (FOCS), 2017, : 880 - 889
  • [23] THE BINNING ANALYSIS - TOWARDS A BETTER SIGNIFICANCE TEST
    GOSSET, E
    LOUIS, B
    ASTROPHYSICS AND SPACE SCIENCE, 1986, 120 (02) : 263 - 306
  • [24] Rare Variant Collapsing Test with Variable Binning
    Drichel, D.
    Lacour, A.
    Herold, C.
    Schueller, V.
    Vaitsiakhovich, T.
    Becker, T.
    HUMAN HEREDITY, 2015, 79 (01) : 33 - 34
  • [25] AN ALTERNATIVE TEST FOR UNIFORMITY
    Chen, Zhenmin
    Ye, Chunmiao
    INTERNATIONAL JOURNAL OF RELIABILITY QUALITY & SAFETY ENGINEERING, 2009, 16 (04): : 343 - 356
  • [26] Adaptive Random Testing: The ART of test case diversity
    Chen, Tsong Yueh
    Kuo, Fei-Ching
    Merkel, Robert G.
    Tse, T. H.
    JOURNAL OF SYSTEMS AND SOFTWARE, 2010, 83 (01) : 60 - 66
  • [27] Balancing Test Accuracy and Security in Computerized Adaptive Testing
    Feng, Wanyong
    Ghosh, Aritra
    Sireci, Stephen
    Lan, Andrew S.
    ARTIFICIAL INTELLIGENCE IN EDUCATION, AIED 2023, 2023, 13916 : 708 - 713
  • [28] Review of the shadow-test approach to adaptive testing
    van der Linden W.J.
    Behaviormetrika, 2022, 49 (2) : 169 - 190
  • [29] Development of Computer Literacy Test as Computerized Adaptive Testing
    Ozbasi, Durmus
    Demirtasli, Nukhet
    JOURNAL OF MEASUREMENT AND EVALUATION IN EDUCATION AND PSYCHOLOGY-EPOD, 2015, 6 (02): : 218 - 237
  • [30] The Test Ability of an Adaptive Pulse Wave for ADC Testing
    Sheng, Xiaoqin
    Kerkhoff, Hans G.
    2010 19TH IEEE ASIAN TEST SYMPOSIUM (ATS 2010), 2010, : 289 - 294