Nano-level position resolution for particle tracking in digital in-line holographic microscopy

被引:7
|
作者
Lei, H. [1 ]
Hu, X. [1 ]
Zhu, P. [2 ]
Chang, X. [1 ]
Zeng, Y. [1 ]
Hu, C. [1 ]
Li, H. [1 ,3 ]
Hu, X. [1 ]
机构
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
[2] Tianjin Univ, Key Lab Optoelect Informat Technol, Tianjin 300072, Peoples R China
[3] Univ British Columbia, Dept Chem, Vancouver, BC V6T 1Z1, Canada
基金
美国国家科学基金会;
关键词
Digital holographic microscopy; empirical mode decomposition; image analysis; measurement; particle; EMPIRICAL MODE DECOMPOSITION; DECONVOLUTION; SPECTRUM;
D O I
10.1111/jmi.12271
中图分类号
TH742 [显微镜];
学科分类号
摘要
Three-dimensional particle tracking in biological systems is a quickly growing field, many techniques have been developed providing tracking characters. Digital in-line holographic microscopy is a valuable technique for particle tracking. However, the speckle noise, out-of-focus signals and twin image influenced the particle tracking. Here an adaptive noise reduction method based on bidimensional ensemble empirical mode decomposition is introduced into digital in-line holographic microscopy. It can eliminate the speckle noise and background of the hologram adaptively. Combined with the three-dimensional deconvolution approach in the reconstruction, the particle feature would be identified effectively. Tracking the fixed beads on the cover-glass with piezoelectric stage through multiple holographic images demonstrate the tracking resolution, which approaches 2 nm in axial direction and 1 nm in transverse direction. This would facilitate the development and use in the biological area such as living cells and single-molecule approaches.
引用
收藏
页码:100 / 106
页数:7
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