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Nano-level position resolution for particle tracking in digital in-line holographic microscopy
被引:7
|作者:
Lei, H.
[1
]
Hu, X.
[1
]
Zhu, P.
[2
]
Chang, X.
[1
]
Zeng, Y.
[1
]
Hu, C.
[1
]
Li, H.
[1
,3
]
Hu, X.
[1
]
机构:
[1] Tianjin Univ, State Key Lab Precis Measuring Technol & Instrume, Tianjin 300072, Peoples R China
[2] Tianjin Univ, Key Lab Optoelect Informat Technol, Tianjin 300072, Peoples R China
[3] Univ British Columbia, Dept Chem, Vancouver, BC V6T 1Z1, Canada
基金:
美国国家科学基金会;
关键词:
Digital holographic microscopy;
empirical mode decomposition;
image analysis;
measurement;
particle;
EMPIRICAL MODE DECOMPOSITION;
DECONVOLUTION;
SPECTRUM;
D O I:
10.1111/jmi.12271
中图分类号:
TH742 [显微镜];
学科分类号:
摘要:
Three-dimensional particle tracking in biological systems is a quickly growing field, many techniques have been developed providing tracking characters. Digital in-line holographic microscopy is a valuable technique for particle tracking. However, the speckle noise, out-of-focus signals and twin image influenced the particle tracking. Here an adaptive noise reduction method based on bidimensional ensemble empirical mode decomposition is introduced into digital in-line holographic microscopy. It can eliminate the speckle noise and background of the hologram adaptively. Combined with the three-dimensional deconvolution approach in the reconstruction, the particle feature would be identified effectively. Tracking the fixed beads on the cover-glass with piezoelectric stage through multiple holographic images demonstrate the tracking resolution, which approaches 2 nm in axial direction and 1 nm in transverse direction. This would facilitate the development and use in the biological area such as living cells and single-molecule approaches.
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页码:100 / 106
页数:7
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