Microwave power self-coherent reference measurement based on ensembles of nitrogen-vacancy centers in diamond

被引:0
|
作者
Li, Zhonghao [1 ,2 ,3 ]
Yang, Chenyu [1 ,2 ,3 ]
Huang, Yingying [1 ,2 ,3 ]
Guo, Hao [1 ,2 ,3 ]
Wen, Huanfei [1 ,2 ,3 ]
Li, Xin [1 ,2 ,3 ]
Ma, Zongmin [1 ,2 ]
Tang, Jun [1 ,2 ,4 ]
Liu, Jun [1 ,2 ,3 ]
机构
[1] North Univ China, State Key Lab Dynam Measurement Technol, Taiyuan 030051, Peoples R China
[2] Key Lab Quantum Sensing & Precis Measurement, Taiyuan 030051, Shanxi, Peoples R China
[3] North Univ China, Inst Instrument & Elect, Taiyuan 030051, Peoples R China
[4] North Univ China, Sch Semicond & Phys, Taiyuan 030051, Peoples R China
来源
OPTICS EXPRESS | 2024年 / 32卷 / 13期
基金
中国国家自然科学基金;
关键词
37;
D O I
10.1364/OE.526072
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Microwave detection based on optical detection magnetic resonance technology (ODMR) of nitrogen -vacancy (NV) centers is simple and non-invasive. However, in high microwave power ranges, saturation appears and cannot be used for accurate power measurement. The self -coherent reference measurement for high -power microwave based on ODMR of NV centers has been demonstrated. Firstly, by introducing the principle of microwave self -coherent reference, that is, by adjusting the phase difference to achieve power regulation of microwave, a conversion model by phase modulation between enhancement and attenuation of microwave power is introduced. Then, the microwave self -coherent reference measurement is established under combinations of microwave power with different phase settings. Combined with the frequency modulation technology, the sensitivity of measurement is significantly improved from 4.59 nT/Hz 1 / 2 to 67.69 pT/Hz 1 / 2 . The maximum measurement range of microwave power can be extended to 2 x 10 4 times the initial saturated power of direct measurement with ODMR. The results show that the method efficiently overcomes saturation under the direct measurement of ODMR and provides useful technical assistance for near -field detection, performance monitoring, and problem diagnostics for microwave devices. (c) 2024 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
引用
收藏
页码:23193 / 23203
页数:11
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