Special Issue on Silicon Lifecycle Management

被引:0
|
作者
Tahoori, Mehdi [1 ]
Zorian, Yervant [2 ]
机构
[1] Karlsruhe Inst Technol, D-76131 Karlsruhe, Germany
[2] Synopsys Inc, Sunnyvale, CA 94085 USA
关键词
D O I
10.1109/MDAT.2024.3392620
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The Semiconductor Industry faces mounting challenges with the rapid advancement of device and system complexity. While increased transistor densities and smaller feature sizes present opportunities for enhanced capabilities, they also bring about significant hurdles such as heightened manufacturing variability and sensitivity to runtime and workload effects. Moreover, higher design densities result in elevated current and power densities, necessitating solutions for maintaining voltage supply levels and managing heat dissipation. Complicated factors like chip placement, system arrangements, and hardware-software interactions further elevate the risk of physical failure, making it challenging to model, mitigate, or identify issues during the design, manufacturing, and testing phases. © 2013 IEEE.
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页码:5 / 6
页数:2
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