Memory Switching versus Threshold Memory Switching: Finding a Promising Synaptic Device for Brain-Inspired Artificial Learning Systems

被引:0
|
作者
Yadav, Mani Shankar [1 ]
Varshney, Kanupriya [1 ]
Rawat, Brajesh [1 ]
机构
[1] Indian Inst Technol Ropar, Dept Elect Engn, Rupnagar 140001, Punjab, India
来源
ACS APPLIED ENGINEERING MATERIALS | 2024年 / 2卷 / 08期
关键词
resistive switching; NbO2-HfO x; multilevel state; artificialsynapse; cross-point array; pattern recognition; brain-inspired; artificial learning systems; RESISTIVE MEMORY; CROSSBAR ARRAYS; IN-MEMORY;
D O I
10.1021/acsaenm.4c00307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The integration of a selector layer with resistive switching devices has emerged as a promising strategy for developing large-scale cross-point memory by mitigating sneak path currents. However, their performance benefits in obtaining tunable states for emulating the synapses have remained unexplored. In this context, we investigate the device-to-cross-point array (CPA)-level performance of the NbO2-HfOx-based threshold selector-memory switching (TS-MS) device and explore the performance advantages over the HfOx-based memory switching (MS) device for artificial synapses using a fully calibrated multiscale modeling framework. Our findings reveal that the TS-MS device offers highly linear and symmetric long-term potentiation (LTP) and long-term depression (LTD) over the HfOx-based MS device. The NbO2-HfOx-based TS-MS device demonstrates more linear conductance modulation and well-separated multilevel-state operations, which result in a 1.7x reduction in reading inaccuracy and a 4.6x improvement in power efficiency (PE) compared to the MS device, particularly in a 64 x 64 cross-point array under worst-case scenarios. Furthermore, the application of the TS-MS-based bioinspired learning system, with a 15 x 6 cross-point array (CPA), reveals enhanced recognition accuracy and power efficiency over the MS-based cell for a 5 x 3 pixel grayscale image, even in the presence of high noise percentages and intercell wire resistance. Notably, the TS-MS-based CPA demonstrates around 3x reduction in average energy consumption compared to the MS-based CPA for recognizing digital digits. The comprehensive analysis presented in this study suggests that the TS-MS device stands out as a more viable candidate for hardware implementations of brain-inspired artificial learning systems.
引用
收藏
页码:2131 / 2142
页数:12
相关论文
共 50 条
  • [41] Modulating the filament rupture degree of threshold switching device for self-selective and low-current nonvolatile memory application
    Zhao, Xiaolong
    Niu, Jiebin
    Yang, Yang
    Xiao, Xiangheng
    Chen, Rui
    Wu, Zuheng
    Zhang, Ying
    Lv, Hangbing
    Long, Shibing
    Liu, Qi
    Jiang, Changzhong
    Liu, Ming
    [J]. NANOTECHNOLOGY, 2020, 31 (14)
  • [42] Highly-Scalable Threshold Switching Select Device based on Chaclogenide Glasses for 3D Nanoscaled Memory Arrays
    Lee, Myoung-Jae
    Lee, Dongsoo
    Kim, Hojung
    Choi, Hyun-Sik
    Park, Jong-Bong
    Kim, Hee Goo
    Cha, Young-Kwan
    Chung, U-In
    Yoo, In-Kyeong
    Kim, Kinam
    [J]. 2012 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2012,
  • [43] Switching Speed Analysis and Controlled Oscillatory Behavior of a Cr-doped V2O3 Threshold Switching Device for Memory Selector and Neuromorphic Computing Application
    Hennen, T.
    Bedau, D.
    Rupp, J. A. J.
    Funck, C.
    Menzel, S.
    Grobis, M.
    Waser, R.
    Wouters, D. J.
    [J]. 2019 IEEE 11TH INTERNATIONAL MEMORY WORKSHOP (IMW 2019), 2019, : 44 - 47
  • [44] Understanding the neurobiological mechanisms of learning and memory:: memory systems of the brain, long-term potentiation and synaptic plasticity.: Part III B
    Leff, P
    Romo, H
    Matus, M
    Hernández, A
    Calva, JC
    Acevedo, R
    Torner, C
    Gutiérrez, R
    Anton, B
    [J]. SALUD MENTAL, 2002, 25 (04) : 78 - 94
  • [45] Stable reconfiguring, high-density memory and synaptic characteristics in Sn alloyed CsPbI3 perovskite based resistive switching device
    Huang, Min
    Hou, Mingshu
    Xing, Haiyang
    Tu, Jiale
    Jia, Shuanglian
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2023, 934
  • [46] Tau-Induced Defects in Synaptic Plasticity, Learning, and Memory Are Reversible in Transgenic Mice after Switching Off the Toxic Tau Mutant
    Sydow, Astrid
    Van der Jeugd, Ann
    Zheng, Fang
    Ahmed, Tariq
    Balschun, Detlef
    Petrova, Olga
    Drexler, Dagmar
    Zhou, Lepu
    Rune, Gabriele
    Mandelkow, Eckhard
    D'Hooge, Rudi
    Alzheimer, Christian
    Mandelkow, Eva-Maria
    [J]. JOURNAL OF NEUROSCIENCE, 2011, 31 (07): : 2511 - 2525
  • [47] Large Resistive Switching and Artificial Synaptic Behaviors in Layered Cs3Sb2I9 Lead-Free Perovskite Memory Devices
    Paramanik, Subham
    Maiti, Abhishek
    Chatterjee, Soumyo
    Pal, Amlan J.
    [J]. ADVANCED ELECTRONIC MATERIALS, 2022, 8 (01):
  • [48] Compliance-Free and Forming-Free Digital and Analog Resistive Switching in a Perovskite-Based Artificial Synaptic Device: Mimicking Classical Pavlovian Learning
    Hasina, Dilruba
    Yadav, Kusampal
    Mukherjee, Devajyoti
    [J]. ACS APPLIED ELECTRONIC MATERIALS, 2024, 6 (05) : 3676 - 3687
  • [49] A synaptic device built in one diode-one resistor (1D-1R) architecture with intrinsic SiOx-based resistive switching memory
    Chang, Yao-Feng
    Fowler, Burt
    Chen, Ying-Chen
    Zhou, Fei
    Pan, Chih-Hung
    Chang, Kuan-Chang
    Tsai, Tsung-Ming
    Chang, Ting-Chang
    Sze, Simon M.
    Lee, Jack C.
    [J]. PHYSICAL SCIENCES REVIEWS, 2016, 1 (04)
  • [50] Crossbar Arrays based on "Wall" Phase-Change Memory (PCM) and Ovonic-Threshold Switching (OTS) Selector: a Device Integration Challenge Towards New Computing Paradigms in Embedded Applications
    Bourgeois, G.
    Meli, V.
    Antonelli, R.
    Socquet-Clerc, C.
    Magis, T.
    Laulagnet, F.
    Hemard, B.
    Bernard, M.
    Fellouh, L.
    Dezest, P.
    Krawczyk, J.
    Dominguez, S.
    Baudin, F.
    Garrione, J.
    Pellissier, C.
    Dallery, J. -A.
    Castellani, N.
    Cyrille, M. -C.
    Charpin, C.
    Andrieu, F.
    Navarro, G.
    [J]. 2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM, 2023,