Machine learning in industrial X-ray computed tomography - a review

被引:0
|
作者
Bellens, Simon [1 ,3 ]
Guerrero, Patricio [3 ]
Vandewalle, Patrick [2 ]
Dewulf, Wim [3 ]
机构
[1] Materialise NV, Technol Laan 15, Leuven, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn ESAT, EAVISE, PSI, Jan Pieter Nayerlaan 5, St Katelijne Waver, Belgium
[3] Katholieke Univ Leuven, Dept Mech Engn, Celestijnenlaan 300, Leuven, Belgium
关键词
Industrial Computed Tomography; Machine Learning; Deep Learning; Industry; 4.0;
D O I
10.1016/j.cirpj.2024.05.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray computed tomography (XCT) has been shown to be a reliable tool for quality inspection, material evaluation, and dimensional measurement tasks across diverse academic and industrial applications. In recent years, the integration of machine learning and deep learning techniques have ushered new advances in the industrial computed tomography domain spanning multiple facets, including image reconstruction, segmentation, and feature characterization. This review paper comprehensively surveys the current state-of-the-art machine learning and deep learning applications throughout the entire XCT workflow. Additionally, we explore relevant developments in the medical imaging domain, evaluating their implications for industrial computed tomography. In conclusion, we identify potential future research, drawing insights from existing research gaps in the domain and recent advancements in artificial intelligence. Notably, we underscore the importance of uncertainty quantification and model explainability for further acceptance of artificial intelligence techniques in the domain.
引用
收藏
页码:324 / 341
页数:18
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