Molybdenum doped indium oxide thin films grown on mica substrates with high near-infrared transparency and electron mobility for flexible optoelectronic and spintronic applications
被引:1
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作者:
Liu, Jindong
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h-index: 0
机构:
Yantai Univ, Sch Phys & Elect Informat, Yantai 264005, Peoples R ChinaYantai Univ, Sch Phys & Elect Informat, Yantai 264005, Peoples R China
Liu, Jindong
[1
]
机构:
[1] Yantai Univ, Sch Phys & Elect Informat, Yantai 264005, Peoples R China
Flexible electronics;
Transparent conductors;
Diluted magnetic semiconductors;
Mica;
High near-infrared transparency;
High electron mobility;
HETEROEPITAXY;
PERFORMANCE;
MO;
D O I:
10.1016/j.ceramint.2024.04.172
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
In the era of the artificial intelligence, flexible multifunctional films that combine optical transparency, electrical conductivity, and ferromagnetism are highly beneficial for many advanced applications. Herein, we fabricated a flexible magnetic transparent conductor molybdenum doped indium oxide (IMoO) thin film on a mica substrate using a pulsed laser deposition (PLD) technique. The valence states of Mo dopants were determined to be Mo 4+ and Mo 6+ by X-ray photoelectron spectroscopy (XPS) analysis. From the measured optical transmittance spectrum, average visible (Vis) and near -infrared (NIR) transmittance (T ave_Vis and T ave_NIR ) values in IMoO film are calculated to be 85.9 % and 85.4 %, respectively. The IMoO film shows an electron mobility ( mu e ) of around 113 cm 2 V -1 s -1 and a sheet resistance (R s ) of 69 Omega. We illustrate the benefits of Mo doping, which leads to increased NIR transparency and mu e compared to commercially available tin -doped indium oxide (ITO). On the other hand, the IMoO film shows clear magnetic hysteretic behaviors at room temperature, indicating the presence of ferromagnetism. The main origin of the ferromagnetism is presumably attributed to the Mo 4+ ions with an electronic configuration of 4 d 2 . Bending cyclic tests reveal favourable mechanical durability and bending stability in the IMoO/mica films. Our systematic investigation demonstrates that IMoO film possesses a superior optoelectronic performance beyond ITO, Mn-doped indium oxide (IMnO), and Sn-Mn-codoped indium oxide (ITMnO), substantiating the potential of the IMoO/mica film as a high-performance transparent conductive magnetic material for flexible optoelectronic and spintronic applications.
机构:
Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Wang, K.
Liu, Yanwen
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机构:
Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Fudan Univ, Dept Phys, Shanghai 200433, Peoples R ChinaFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Liu, Yanwen
Wang, Weiyi
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机构:
Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Fudan Univ, Dept Phys, Shanghai 200433, Peoples R ChinaFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Wang, Weiyi
Meyer, N.
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机构:
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Meyer, N.
Bao, L. H.
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机构:
Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Bao, L. H.
He, L.
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机构:
Univ Calif Los Angeles, Dept Elect Engn, Device Res Lab, Los Angeles, CA 90095 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
He, L.
Lang, M. R.
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机构:
Univ Calif Los Angeles, Dept Elect Engn, Device Res Lab, Los Angeles, CA 90095 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Lang, M. R.
Chen, Z. G.
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机构:
Univ Queensland, Brisbane, Qld 4072, AustraliaFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Chen, Z. G.
Che, X. Y.
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机构:
Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Che, X. Y.
Post, K.
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机构:
Univ Calif San Diego, Dept Phys, San Diego, CA 92093 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Post, K.
Zou, J.
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h-index: 0
机构:
Univ Queensland, Brisbane, Qld 4072, Australia
Univ Queensland, Ctr Microscopy & Microanal, Brisbane, Qld 4072, AustraliaFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Zou, J.
Basov, D. N.
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机构:
Univ Calif San Diego, Dept Phys, San Diego, CA 92093 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Basov, D. N.
Wang, K. L.
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机构:
Univ Calif Los Angeles, Dept Elect Engn, Device Res Lab, Los Angeles, CA 90095 USAFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Wang, K. L.
Xiu, Faxian
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机构:
Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
Fudan Univ, Dept Phys, Shanghai 200433, Peoples R ChinaFudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China