Reliability and maintainability estimation of a multi-failure-cause system under imperfect maintenance

被引:1
|
作者
Safaei, Fatemeh [1 ]
Taghipour, Sharareh [1 ]
机构
[1] Toronto Metropolitan Univ, Dept Mech Ind & Mechatron Engn, Toronto, ON, Canada
关键词
imperfect repair; Kijima model; maintainability; multi-failure-cause system; reliability; RUL estimation; NATURAL-GAS TRANSMISSION; PREVENTIVE MAINTENANCE; REPAIRABLE SYSTEMS; PROBABILITY; MANAGEMENT;
D O I
10.1002/qre.3595
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Estimating the reliability and maintainability (R & M) parameters is crucial in various industrial applications. It serves purposes such as evaluating system performance and safety, minimising the risk and cost of potential failures, and designing efficient maintenance strategies. This task becomes challenging for complex repairable systems, where failures can occur due to different causes and performance may be affected by various covariates (such as material, environment, and labour). Another challenge in R & M studies arises from the presence of censorship in failure times. Existing methodologies often fail to account for all the aforementioned aspects of system-related data in R & M analysis. By incorporating valuable information from covariates and utilising data from censored failure times alongside complete failure data, the accuracy of R & M parameter estimation can be significantly improved. This paper develops reliability models for repairable systems with multiple failure causes in the presence of covariates. The system can also be subject to imperfect maintenance. The R & M parameters are then estimated by applying the Kijima Type I and II model's virtual age concept. The proposed technique is illustrated using two case studies on gas pipelines and aero-engine systems. Through these case studies, we show that the proposed method not only provides more efficient estimates of the R & M parameters compared to the alternative approach, but it is also easier to apply and yields more straightforward interpretations.
引用
收藏
页码:3487 / 3516
页数:30
相关论文
共 50 条
  • [31] Fuzzy Reliability Evaluation of a Repairable System with Imperfect Coverage, Reboot and Common-cause Shock Failure
    Jain, M.
    Agrawal, S. C.
    Preeti, Ch.
    INTERNATIONAL JOURNAL OF ENGINEERING, 2012, 25 (03): : 231 - 238
  • [32] Optimal Selective Maintenance for Multi-State Systems under Imperfect Maintenance
    Liu, Yu
    Huang, Hong-Zhong
    Zuo, Ming J.
    ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2009 PROCEEDINGS, 2009, : 322 - +
  • [33] Reliability parameters estimation for parallel systems under imperfect repair
    Ghnimi, Soumaya
    Gasmi, Soufiane
    Nasr, Arwa
    METRIKA, 2017, 80 (03) : 273 - 288
  • [34] Reliability parameters estimation for parallel systems under imperfect repair
    Soumaya Ghnimi
    Soufiane Gasmi
    Arwa Nasr
    Metrika, 2017, 80 : 273 - 288
  • [35] Investigation of system transient availability under imperfect maintenance
    Alaswad, Suzan
    Salman, Sinan
    INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2024, 41 (02) : 656 - 673
  • [36] Redundancy System Fault Sampling Under Imperfect Maintenance
    Zhang, Chao
    Guo, Linhan
    Xiao, Boping
    Kang, Rui
    2013 PROGNOSTICS AND HEALTH MANAGEMENT CONFERENCE (PHM), 2013, 33 : 1057 - 1062
  • [37] Fault Sampling of Complex System Under Imperfect Maintenance
    Zhang, Chao
    Guo, Linhan
    INTERNATIONAL JOURNAL OF ONLINE ENGINEERING, 2013, 9 (04) : 10 - 14
  • [38] RELIABILITY AND MAINTAINABILITY OF A MULTICOMPONENT SERIES-PARALLEL SYSTEM WITH SIMULTANEOUS FAILURE UNDER PREEMPTIVE REPEAT REPAIR DISCIPLINE
    KODAMA, M
    SAWA, I
    MICROELECTRONICS AND RELIABILITY, 1986, 26 (01): : 163 - 181
  • [39] RELIABILITY AND MAINTAINABILITY OF A MULTICOMPONENT SERIES-PARALLEL SYSTEM WITH SIMULTANEOUS FAILURE UNDER PREEMPTIVE REPEAT REPAIR DISCIPLINE
    KODAMA, M
    LECTURE NOTES IN ECONOMICS AND MATHEMATICAL SYSTEMS, 1984, 235 : 85 - 104
  • [40] APPROXIMATED RELIABILITY OF R-OUT-OF-N(F) SYSTEM WITH COMMON CAUSE FAILURE AND MAINTENANCE
    HIDAKA, T
    MICROELECTRONICS AND RELIABILITY, 1992, 32 (06): : 817 - 832