A Latch-based Stochastic Number Generator for Stochastic Computing of Extended Naive Bayesian Network

被引:0
|
作者
Zhang, Ruilin [1 ,2 ]
Xiao, Yangjun [3 ]
Liu, Jiawei [4 ]
Wang, Xingyu [5 ]
Xu, Shufan [1 ]
Liu, Kunyang [1 ,2 ]
Nishizawa, Shinichi [5 ]
Niitsu, Kiichi [1 ]
Shinohara, Hirofumi [5 ]
机构
[1] Kyoto Univ, Grad Sch Informat, Kyoto, Japan
[2] Waseda Univ, Informat Prod & Syst Res Ctr, Tokyo, Japan
[3] Lenovo, Beijing, Peoples R China
[4] China Construct Bank, Beijing, Peoples R China
[5] Waseda Univ, Grad Sch Informat Prod & Syst, Tokyo, Japan
关键词
stochastic computing; Bayesian network; stochastic number generator; true random number generator;
D O I
10.1109/VLSITSA60681.2024.10546408
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Stochastic computing (SC) employing probability bitstreams is a low-cost and error-tolerant computing paradigm applied in Bayesian networks, etc. A stochastic number generator (SNG) is utilized to generate the bitstreams with specified probability. Instead of the conventional comparator and linear feedback shift register-based SNG, in this work, we propose 1) a latch-based stochastic number generator (L-SNG) that directly generates period-less true random bitstream with a specified probability of ones; 2) an extended naive Bayesian network that enhances classification accuracy by introducing evidence-to-evidence correlation factors in a conventional naive Bayesian network. Experimental results on a 130-nm CMOS test chip of L-SNG with the extended Bayesian network model using Sloth dataset demonstrate: 1) a 10% improvement in classification accuracy compared with the naive Bayesian network; 2) equivalent accuracy of 90% as in numerical computing using only 256-bit bitstreams; 3) high robustness with the same accuracy under conditions ranging from 0.7 V to 0.9 V and -20 degrees C to 100 degrees C.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Strained MTJs']Js with Latch-based Sensing for Stochastic Computing
    Bhuin, Sudipta
    Biswas, Ayan K.
    Pileggi, Larry
    2017 IEEE 17TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO), 2017, : 1027 - 1030
  • [2] Sampling Based Random Number Generator for Stochastic Computing
    Karadeniz, M. Burak
    Altun, Mustafa
    2017 24TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS), 2017, : 227 - 230
  • [3] Low-cost stochastic number generator based on MRAM for stochastic computing
    Wang, You
    Wu, Bi
    Cai, Hao
    Liu, Weiqiang
    PROCEEDINGS OF THE 17TH ACM INTERNATIONAL SYMPOSIUM ON NANOSCALE ARCHITECTURES, NANOARCH 2022, 2022,
  • [4] Spin-Hall-Effect-Based Stochastic Number Generator for Parallel Stochastic Computing
    Hu, Jiaxi
    Li, Bingzhe
    Ma, Cong
    Lilja, David
    Koester, Steven J.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 66 (08) : 3620 - 3627
  • [5] A light-weight implementation of latch-based true random number generator
    Fujieda, Naoki
    Kishibe, Hitomi
    Ichikawa, Shuichi
    2019 15TH INTERNATIONAL WIRELESS COMMUNICATIONS & MOBILE COMPUTING CONFERENCE (IWCMC), 2019, : 901 - 906
  • [6] Evaluation of Latch-based Physical Random Number Generator Implementation on 40 nm ASICs
    Torii, Naoya
    Yamamoto, Dai
    Matsumoto, Tsutomu
    TRUSTED'16: PROCEEDINGS OF THE INTERNATIONAL WORKSHOP ON TRUSTWORTHY EMBEDDED DEVICES, 2016, : 23 - 30
  • [7] Building a Better Random Number Generator for Stochastic Computing
    Neugebauer, Florian
    Polian, Ilia
    Hayess, John P.
    2017 EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD), 2017, : 1 - 8
  • [8] Implementation of Izhikevich neuron based on stochastic computing using a novel inspired Omega-Flip stochastic number generator
    Hedayatpour, Mohammad Ali
    Karami, Mohammad Azim
    Shamsi, Jafar
    INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 2022, 50 (09) : 3104 - 3118
  • [9] Design and Implementation of an On-Line Quality Control System for Latch-Based True Random Number Generator
    Fujieda, Naoki
    Ichikawa, Shuichi
    Oya, Ryusei
    Kishibe, Hitomi
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2023, E106D (12) : 1940 - 1950
  • [10] Fault diagnosis of generator bearing based on stochastic variational inference Bayesian neural network
    Wang J.-H.
    Yue L.-H.
    Cao J.
    Ma J.-L.
    Kongzhi yu Juece/Control and Decision, 2023, 38 (04): : 1015 - 1021