FORTIFY: Analytical Pre-Silicon Side-Channel Characterization of Digital Designs

被引:0
|
作者
Lakshmy, A., V [1 ]
Rebeiro, Chester [1 ]
Bhunia, Swarup [2 ]
机构
[1] Indian Inst Technol Madras, Madras, Tamil Nadu, India
[2] Univ Florida, Gainesville, FL 32611 USA
关键词
Power side-channel attacks; Pre-Silicon leakage evaluation; Analytical model;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Power side-channel attacks are potent security threats that exploit the power consumption patterns of an electronic device to glean sensitive information ranging from secret keys and passwords to web-browsing activity. While pre-Silicon tools promise early detection of side-channel leakage at the design stage, they require several hours of simulation time. In this paper, we present an analytical framework called FORTIFY that estimates the power side-channel vulnerability of digital circuit designs at signal-level granularity, given the RTL or gate-level netlist of the design, at least 100 times faster than contemporary works. We demonstrate the correctness of FORTIFY by comparing it with a recent simulation-based side-channel leakage analysis framework. We also test its scalability by evaluating FORTIFY on an open-source System-on-Chip.
引用
收藏
页码:660 / 665
页数:6
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