Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Scanning probe microscopy (SPM) is a broad family of diagnostic methods. Common restraint of SPM is only surficial interaction with specimen, especially troublesome in case of complex volumetric systems, e.g. microbial or microelectronic. Scanning thermal microscopy (SThM) overcomes that constraint, since thermal information is collected from broader space. We present transformer bridge-based setup for resistive nanoprobe-based microscopy. With low-frequency (LF) (approx. 1 kHz) detection signal bridge resolution becomes independent on parasitic capacitances present in the measurement setup. We present characterisation of the setup and metrological description-with resolution of the system 0.6 mK with sensitivity as low as 5 mV K-1. Transformer bridge setup brings galvanic separation, enabling measurements in various environments, pursued for purposes of molecular biology. We present results SThM measurement results of high-thermal contrast sample of carbon fibres in an epoxy resin. Finally, we analyse influence of thermal imaging on topography imaging in terms of information channel capacity. We state that transformer bridge-based SThM system is a fully functional design along with low driving frequencies and resistive thermal nanoprobes by Kelvin Nanotechnology.