Nonlinear acoustic response in nanoparticle-dielectric systems and nondestructive assessment of particle agglomeration

被引:0
|
作者
Zhang, Shuo [1 ]
Cheng, Li [1 ]
Wang, Hanqing [1 ,2 ]
Qiu, Yonglin [1 ]
Yang, Lijun [1 ]
Zhao, Xuetong [1 ]
机构
[1] Chongqing Univ, Sch Elect Engn, State Key Lab Power Transmiss Equipment Technol, Chongqing 400044, Peoples R China
[2] Contemporary Amperex Future Energy Res Inst Shangh, Shanghai 201109, Peoples R China
基金
中国国家自然科学基金;
关键词
Agglomeration interface; Dispersive characterization; Nanodielectric; Nonlinear ultrasonic; Nondestructive testing; NANOCOMPOSITES; DISPERSION; MICROSTRUCTURE; DEFORMATION; INCLUSIONS; INSULATION; DAMAGE;
D O I
10.1016/j.colsurfa.2024.133969
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Nanoparticle agglomeration reduces the modification effect of nanocomposites, and there is a need to investigate a technique for evaluating the overall particle dispersion within the material, which in turn ensures the modification effect of the material. In this paper, a non-destructive testing technique for nanoparticle dispersion based on nonlinear ultrasonic (NLUS) is proposed to rapidly assess the overall nanoparticle dispersion within a material. An interfacial mismatch model describing different degrees of nanoparticle agglomeration was firstly developed, and then the nonlinear acoustic response of the nanoparticle-dielectric system was quantitatively solved, and the theoretical model was validated in conjunction with NLUS tests. The experimental results show that agglomerated interfaces are the source of the nonlinear response of nanodielectrics and that the microscopically generated nonlinear effects can be equivalently accumulated to the mesoscopic domain, with the error in the theoretically calculated values of the two being less than 5%; The NLUS technique eliminates the need for cumbersome steps such as particle size counting, and its small number of rapid detection results are close to the statistical convergence of the particle size of the 250 particles accumulated in the imaging image of the scanning electron microscope, with an error of between 3% similar to and 13%. With a single inspection area of 339 mm3, the NLUS technology significantly reduces evaluation time and cost while expanding the inspection area, offering the combined advantages of speed, wide field of view, and non-destructiveness.
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页数:11
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