Machine/deep learning-assisted hemoglobin level prediction using palpebral conjunctival images

被引:0
|
作者
Kato, Shota [1 ]
Chagi, Keita [2 ]
Takagi, Yusuke [2 ]
Hidaka, Moe [1 ]
Inoue, Shutaro [1 ]
Sekiguchi, Masahiro [1 ]
Adachi, Natsuho [1 ]
Sato, Kaname [1 ]
Kawai, Hiroki [2 ]
Kato, Motohiro [1 ]
机构
[1] Univ Tokyo, Grad Sch Med, Dept Pediat, 7-3-1 Hongo,Bunkyo Ku, Tokyo 1138655, Japan
[2] LPIXEL Inc, Tokyo, Japan
基金
日本学术振兴会;
关键词
artificial intelligence; CNN model; grad-CAM; non-invasive anaemia prediction; ANEMIA;
D O I
10.1111/bjh.19621
中图分类号
R5 [内科学];
学科分类号
1002 ; 100201 ;
摘要
Palpebral conjunctival hue alteration is used in non-invasive screening for anaemia, whereas it is a qualitative measure. This study constructed machine/deep learning models for predicting haemoglobin values using 150 palpebral conjunctival images taken by a smartphone. The median haemoglobin value was 13.1 g/dL, including 10 patients with <11 g/dL. A segmentation model using U-net was successfully constructed. The segmented images were subjected to non-convolutional neural network (CNN)-based and CNN-based regression models for predicting haemoglobin values. The correlation coefficients between the actual and predicted haemoglobin values were 0.38 and 0.44 in the non-CNN-based and CNN-based models, respectively. The sensitivity and specificity for anaemia detection were 13% and 98% for the non-CNN-based model and 20% and 99% for the CNN-based model. The performance of the CNN-based model did not improve with a mask layer guiding the model's attention towards the conjunctival regions, however, slightly improved with correction by the aspect ratio and exposure time of input images. The gradient-weighted class activation mapping heatmap indicated that the lower half area of the conjunctiva was crucial for haemoglobin value prediction. In conclusion, the CNN-based model had better results than the non-CNN-based model. The prediction accuracy would improve by using more input data with anaemia.
引用
收藏
页码:1590 / 1598
页数:9
相关论文
共 50 条
  • [41] Machine Learning-assisted Management of a Virtualized Network
    Hayashi, Michiaki
    2018 OPTICAL FIBER COMMUNICATIONS CONFERENCE AND EXPOSITION (OFC), 2018,
  • [42] Machine learning-assisted smart epitaxy of Ⅲ-Ⅴ semiconductors
    Yue Hao
    ScienceChina(Materials), 2024, 67 (09) : 3041 - 3042
  • [43] Machine Learning-Assisted Synthesis of Operational Amplifier
    Lin, Xinyu
    Wu, Qi
    Wang, Haiming
    2024 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY, ICMMT, 2024,
  • [44] Visualizing Uncertainty in Machine Learning-Assisted Measurements
    Shirmohammadi, Shervin
    IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2023, 26 (07) : 20 - 27
  • [45] Scalable machine learning-assisted model exploration and inference using Sciope
    Singh, Prashant
    Wrede, Fredrik
    Hellander, Andreas
    BIOINFORMATICS, 2021, 37 (02) : 279 - 281
  • [46] Machine Learning-Assisted Hybrid ReaxFF Simulations
    Yilmaz, Dundar E.
    Woodward, William Hunter
    van Duin, Adri C. T.
    JOURNAL OF CHEMICAL THEORY AND COMPUTATION, 2021, 17 (11) : 6705 - 6712
  • [47] Machine learning-assisted crystal engineering of a zeolite
    Li, Xinyu
    Han, He
    Evangelou, Nikolaos
    Wichrowski, Noah J.
    Lu, Peng
    Xu, Wenqian
    Hwang, Son-Jong
    Zhao, Wenyang
    Song, Chunshan
    Guo, Xinwen
    Bhan, Aditya
    Kevrekidis, Ioannis G.
    Tsapatsis, Michael
    NATURE COMMUNICATIONS, 2023, 14 (01)
  • [48] Machine Learning-Assisted Design of Material Properties
    Kadulkar, Sanket
    Sherman, Zachary M.
    Ganesan, Venkat
    Truskett, Thomas M.
    ANNUAL REVIEW OF CHEMICAL AND BIOMOLECULAR ENGINEERING, 2022, 13 : 235 - 254
  • [49] Deep Learning-Assisted Ultrasensitive Detection of Gold Nanoparticles Using Light Microscopy Images Captured by a Cellphone Camera
    Song, Chen
    Zhou, Li
    Wang, Yongchen
    Wang, Chao
    Lei, Yu
    Luo, Yan
    Zhao, Jing
    ANALYTICAL CHEMISTRY, 2025, 97 (09) : 5164 - 5170
  • [50] Deep learning-assisted classification of site-resolved quantum gas microscope images
    Picard, Lewis R. B.
    Mark, Manfred J.
    Ferlaino, Francesca
    van Bijnen, Rick
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2020, 31 (02)