A Review: Breakdown Voltage Enhancement of GaN Semiconductors-Based High Electron Mobility Transistors

Gallium Nitride (GaN) based High Electron Mobility Transistors (HEMTs) are regarded as fundamental semiconductor devices for future power electronic applications. Consequently, researchers have directed their efforts toward enhancing critical parameters such as the breakdown voltage (V-br) , cut-off frequency, and operating temperature. Therefore, this review article explores research endeavors concerning the enhancement of V-br in GaN-based HEMTs. The objective is to gain insights into the key factors influencing V-br values and to identify the constraints that govern the optimal performance of HEMTs in power devices. Additionally, this review provides an in-depth examination of select studies that introduce novel techniques for improving V-br values.