Improved Charge Injection Balance in Quantum Dot Light-Emitting Diodes through Interface Texture

被引:0
|
作者
Sun, Xuhao [1 ]
Chen, Xingtong [1 ]
Sun, Xiaojuan [1 ]
Xie, Jiachen [1 ]
Zhou, Luohe [1 ]
Chen, Song [1 ,2 ]
机构
[1] Soochow Univ, Coll Chem Chem Engn & Mat Sci, Suzhou Key Lab Novel Semicond Optoelect Mat & Devi, Suzhou 215123, Jiangsu, Peoples R China
[2] Soochow Univ, Jiangsu Key Lab Adv Negat Carbon Technol, Suzhou 215123, Jiangsu, Peoples R China
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2024年 / 15卷 / 28期
关键词
EFFICIENT; FILMS;
D O I
10.1021/acs.jpclett.4c01486
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The existing methods to improve the charge balance of quantum dot light-emitting diodes (QLEDs) rely on energy-level matching, but these approaches have been limited by material availability and Fermi-level pinning. Here, we propose a solution that does not require changes to the materials' electronic properties. By using nanoimprinting technology to texture the interface between the hole-transporting layer (HTL) and colloidal quantum dot (CQD) layer, we can increase the HTL-CQD contact area. This significantly enhances the hole injection rate while keeping the electron injection rate essentially unchanged. Compared with the conventional planar structure, QLEDs with textured HTL exhibit lower luminance threshold voltage, significantly higher external quantum efficiency at low bias voltages, improved operational stability, and a similar Lambertian factor. Comprehensive measurements confirm that the HTL-CQD interface texture allows more efficient hole injection into CQDs to occur under lower bias, resulting in less CQD charging and more efficient exciton recombination.
引用
收藏
页码:7199 / 7205
页数:7
相关论文
共 50 条
  • [41] Bright and Stable Quantum Dot Light-Emitting Diodes
    Lee, Taesoo
    Kim, Byong Jae
    Lee, Hyunkoo
    Hahm, Donghyo
    Bae, Wan Ki
    Lim, Jaehoon
    Kwak, Jeonghun
    ADVANCED MATERIALS, 2022, 34 (04)
  • [42] Photoelectrochemical investigation of charge injection efficiency for quantum dot light-emitting diode
    Kitano, Keisuke
    Sakakibara, Yusuke
    Kago, Masashi
    Doe, Takahiro
    Ueda, Masaya
    Ryowa, Tatsuya
    Izumi, Makoto
    Nishi, Hiroyasu
    Tatsuma, Tetsu
    Arakawa, Yasuhiko
    APPLIED PHYSICS LETTERS, 2021, 118 (06)
  • [43] Impedance spectroscopy for quantum dot light-emitting diodes
    Qu, Xiangwei
    Sun, Xiaowei
    JOURNAL OF SEMICONDUCTORS, 2023, 44 (09)
  • [44] Improved Efficiency of All-Inorganic Quantum-Dot Light-Emitting Diodes via Interface Engineering
    Xu, Qiulei
    Li, Xinyu
    Lin, Qingli
    Shen, Huaibin
    Wang, Hongzhe
    Du, Zuliang
    FRONTIERS IN CHEMISTRY, 2020, 8
  • [45] Improved performance of CsPbBr3 quantum-dot light-emitting diodes by bottom interface modification
    Zhao, Yang-Yang
    Zhang, Qing-Wen
    Liu, Yue-Feng
    Lv, Chao
    Guo, Shuang
    Liu, Xiang-Ping
    Bi, Yan-Gang
    Li, Hong-Wei
    Wu, Yu-Qing
    ORGANIC ELECTRONICS, 2022, 109
  • [46] Improved performance of quantum dot light-emitting diodes by introducing WO3 hole injection layers
    Kim, Hyun Soo
    Lee, DoHyeong
    Kim, Bada
    Hwang, BoRam
    Kim, Chang Kyo
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2022, 735 (01) : 51 - 60
  • [47] Bright and efficient quantum dot light-emitting diodes with double light-emitting layers
    Zhang, Qin
    Chang, Chun
    Zhao, Weifeng
    Li, Qingcheng
    Li, Feng
    Jin, Xiao
    Zhao, Feng
    Chen, Zhongping
    Li, Qinghua
    OPTICS LETTERS, 2018, 43 (24) : 5925 - 5928
  • [48] Improving the Performance of Quantum Dot Light-Emitting Diodes through Nanoscale Engineering
    Pietryga, Jeffrey M.
    Bae, Wan Ki
    Park, Young-Shin
    Robel, Istvan
    Klimov, Victor I.
    NANOSCALE LUMINESCENT MATERIALS 3, 2014, 61 (05): : 75 - 85
  • [49] Charge injection into light-emitting diodes: theory and experiment
    Philipps-Univ of Marburg, Marburg, Germany
    J Appl Phys, 2 (848-856):
  • [50] Charge injection into light-emitting diodes: Theory and experiment
    Arkhipov, VI
    Emelianova, EV
    Tak, YH
    Bassler, H
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (02) : 848 - 856