A review of in-situ high-temperature characterizations for understanding the processes in metallurgical engineering
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作者:
Yifan Zhao
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Institute of Advanced Structure Technology,Beijing Institute of TechnologyInstitute of Advanced Structure Technology,Beijing Institute of Technology
Yifan Zhao
[1
]
Zhiyuan Li
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Institute of Advanced Structure Technology,Beijing Institute of TechnologyInstitute of Advanced Structure Technology,Beijing Institute of Technology
Zhiyuan Li
[1
]
Shijie Li
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机构:
Institute of Advanced Structure Technology,Beijing Institute of Technology
State Key Laboratory of Advanced Metallurgy,University of Science and TechnologyInstitute of Advanced Structure Technology,Beijing Institute of Technology
Shijie Li
[1
,2
]
Weili Song
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Institute of Advanced Structure Technology,Beijing Institute of TechnologyInstitute of Advanced Structure Technology,Beijing Institute of Technology
Weili Song
[1
]
Shuqiang Jiao
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机构:
State Key Laboratory of Advanced Metallurgy,University of Science and TechnologyInstitute of Advanced Structure Technology,Beijing Institute of Technology
Shuqiang Jiao
[2
]
机构:
[1] Institute of Advanced Structure Technology,Beijing Institute of Technology
[2] State Key Laboratory of Advanced Metallurgy,University of Science and Technology
For the rational manipulation of the production quality of high-temperature metallurgical engineering, there are many challenges in understanding the processes involved because of the black box chemical/electrochemical reactors. To overcome this issue, various in-situ characterization methods have been recently developed to analyze the interactions between the composition, microstructure,and solid–liquid interface of high-temperature electrochemical electrodes and molten salts. In this review, recent progress of in-situ hightemperature characterization techniques is discussed to summarize the advances in understanding the processes in metallurgical engineering. In-situ high-temperature technologies and analytical methods mainly include synchrotron X-ray diffraction(s-XRD), laser scanning confocal microscopy, and X-ray computed microtomography(X-ray μ-CT), which are important platforms for analyzing the structure and morphology of the electrodes to reveal the complexity and variability of their interfaces. In addition, laser-induced breakdown spectroscopy, high-temperature Raman spectroscopy, and ultraviolet–visible absorption spectroscopy provide microscale characterizations of the composition and structure of molten salts. More importantly, the combination of X-ray μ-CT and s-XRD techniques enables the investigation of the chemical reaction mechanisms at the two-phase interface. Therefore, these in-situ methods are essential for analyzing the chemical/electrochemical kinetics of high-temperature reaction processes and establishing the theoretical principles for the efficient and stable operation of chemical/electrochemical metallurgical processes.
机构:
Univ Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
CNRS, UMR LGF 5307, Mines St Etienne, Ctr SMS, F-42023 St Etienne, FranceUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Tiphene, Gabrielle
Baral, Paul
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UCLouvain, Inst Mech Mat & Civil Engn IMMC, B-1348 Louvain La Neuve, BelgiumUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Baral, Paul
Comby-Dassonneville, Solene
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Univ Lyon, INSA Lyon, CNRS, MATEIS UMR 5510, 7 Ave Jean Capelle, F-69621 Villeurbanne, FranceUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Comby-Dassonneville, Solene
Guillonneau, Gaylord
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Univ Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, FranceUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Guillonneau, Gaylord
Kermouche, Guillaume
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CNRS, UMR LGF 5307, Mines St Etienne, Ctr SMS, F-42023 St Etienne, FranceUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Kermouche, Guillaume
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Bergheau, Jean-Michel
Oliver, Warren
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KLA Nanomech Inc, Oak Ridge, TN USAUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France
Oliver, Warren
Loubet, Jean-Luc
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Univ Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, FranceUniv Lyon, CNRS, LTDS UMR 5513, Ecole Cent Lyon, 36 Ave Guy Collongue, F-69134 Ecully, France