Investigation of heat dissipation structure embedded in substrate of power chip based on grid-type thermal through silicon vias

被引:0
|
作者
Hu, Rui [1 ]
Lu, Linhong [1 ]
Bai, Zhongchen [1 ,2 ]
Yang, Fashun [1 ,2 ,3 ]
Ma, Kui [1 ,2 ,3 ]
Ding, Zhao [1 ,2 ,3 ]
机构
[1] Guizhou Univ, Dept Elect, Guiyang 550025, Peoples R China
[2] Semicond Power Device Reliabil Engn Res Ctr, Minist Educ, Guiyang 550025, Peoples R China
[3] Guizhou Prov Key Lab Micronano Elect & Software, Guiyang 550025, Peoples R China
来源
IEICE ELECTRONICS EXPRESS | 2024年 / 21卷 / 11期
关键词
thermal reliability; power chip; back heat dissipation; grid-type TTSV; DESIGN;
D O I
10.1587/elex.21.20240185
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the research on heat dissipation technology of power chips, the back thinning method is adopted. However, the back thinning technology is facing the risk of causing damage to the chips because the mechanical support capacity of the chip is significantly reduced. To improve the heat dissipation capacity of the back side of the power chips while not affecting the mechanical support, the back side grid type thermal TSV (GT-TTSV) heat dissipation structure is proposed. Based on the proposed heat transfer structure, the heat dissipation structure is optimized and verified, and compared with the heat dissipation structure of back thinning technology. Simulation comparative study shows that the proposed structure has better heat and thermal
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页数:6
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