How to choose the best analysis method for your next application
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Hong, Mina
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Industrial Microscopy, Olympus Corporation of America, 110 Magellan Circle, Webster,TX,77598, United StatesIndustrial Microscopy, Olympus Corporation of America, 110 Magellan Circle, Webster,TX,77598, United States
Hong, Mina
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[1] Industrial Microscopy, Olympus Corporation of America, 110 Magellan Circle, Webster,TX,77598, United States
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Univ Cambridge, Dept Pure Math & Math Stat, Ctr Math Sci, Cambridge CB3 0WB, EnglandUniv Cambridge, Dept Pure Math & Math Stat, Ctr Math Sci, Cambridge CB3 0WB, England
Garrod, Bryn
Kubicki, Grzegorz
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Univ Louisville, Dept Math, Louisville, KY 40292 USAUniv Cambridge, Dept Pure Math & Math Stat, Ctr Math Sci, Cambridge CB3 0WB, England
Kubicki, Grzegorz
Morayne, Michal
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Univ Louisville, Dept Math, Louisville, KY 40292 USA
Wroclaw Univ Technol, Inst Math & Comp Sci, PL-50370 Wroclaw, PolandUniv Cambridge, Dept Pure Math & Math Stat, Ctr Math Sci, Cambridge CB3 0WB, England